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Circuit fault setting encryption method for training and examination

A technology of circuit failure and encryption method, which is applied in the direction of educational appliances, instruments, teaching models, etc., to achieve the effect of low consumption

Inactive Publication Date: 2012-06-20
UNIV OF SHANGHAI FOR SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention aims at the problem of too much time-consuming setting of faults in electronic maintenance technical training and examinations, and proposes a circuit fault setting encryption method for training and examinations, which can conveniently set random and concealed circuit faults, saving the past circuit faults A large amount of time required for fault setting work, reducing maintenance costs and time spent on component wear and tear, making training and examination work more economical and efficient

Method used

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  • Circuit fault setting encryption method for training and examination
  • Circuit fault setting encryption method for training and examination
  • Circuit fault setting encryption method for training and examination

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Experimental program
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Embodiment Construction

[0011] figure 1 and figure 2 A two-terminal element and a three-terminal element failure setting formed by the circuit can be used to replace a certain two-terminal element and three-terminal element in the experimental circuit in practice. Component 1 in the figure is a two-terminal component. Components 1.1~1.4 represent four normal or abnormal conditions of component 1, such as: normal parameters, abnormal parameters, open circuit of components, short circuit of components, etc. Shaded areas are encrypted lines. Components 1.5~1.8 are a group of gating devices, and the example in the figure is 4 pairs of short-circuit pin headers. Component 2 in the figure is a three-terminal component. Components 2.1~2.4 represent 4 normal or abnormal conditions of component 2, and the rest are the same as figure 1 exactly the same.

[0012] One of the characteristics of an encrypted circuit is: the randomness of the connection relationship. Any input point on the left is randomly an...

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Abstract

The invention relates to a circuit fault setting encryption method for training and examination. According to the invention, the circuit fault can be set conveniently in a hidden manner when the encryption circuit replaces a normal circuit element; in the device, normal elements and a plurality of fault-liable elements are preset, and a certain fault is set through the encryption circuit and a gating device; and due to the adoption of the encryption circuit, the fault is random and disguised, and a student can detect the fault only through an electric measuring device. Therefore, the abilities of the student utilizing the electric measuring device for measuring and analyzing circuit are trained and tested favorably, thereby achieving the preset purposes of the training and examination; as the normal and faulty elements are pre-set, the fault setting process is only the process of operating the gating device, so as to allow the fault setting to be simple and feasible, and realize the high efficiency of the work; and besides, the disassembly during the training and examination is avoided, so the main normal and abnormal elements have low probability of wastage, accordingly, the experiment circuit device has serviceability.

Description

technical field [0001] The invention relates to a circuit encryption technology, in particular to a circuit fault setting encryption method used for training and examination. Background technique [0002] In the training and examination of electronic maintenance technology, in order to cultivate and test students' ability to measure and analyze circuits, it is required to set different faults in the experimental circuit. These failures should be unpredictable to the students who are trained and tested, and have the randomness of the failure; and generally require that the failure is not easy to be directly found by the naked eye, and often need to be measured by electronic measuring instruments, which has the concealment of the failure. Under this requirement, it is not easy to set up faults with general experimental circuits. Because, the general experimental circuit setting failure is to replace the faulty component with a normal component. If the appearance of the faulty...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09B23/18
Inventor 程海凭李晓欧
Owner UNIV OF SHANGHAI FOR SCI & TECH