Fluctuation source localization method of multi-loop oscillation of novel process industry

Abstract

The invention relates to a fluctuation source localization method of multi-loop oscillation of a novel process industry. According to the method, a frequency domain independent component analysis (ICA) is employed to carry out independent component decomposition on industry historical process data; a variable quantity that plays a leading role in fluctuation oscillation and a dominant frequency can be screened; a local directed coherence analysis is carried out on the screened data; and a cause-and-effect relationship graph is used to visually express a cause-and-effect relationship between loop variables, so that a propagation path of a fluctuation interference can be characterized; process priori knowledge is used to simplify the cause-and-effect relationship graph as well as a threshold automatic searching mode is utilized to filter a secondary cause-and-effect relationship branch, so that a main propagation path of fluctuation is obtained and thus a fluctuation source is localized and identified. Compared with the prior art, the technology employed in the invention enables the method to have the following beneficial effects: a signal analysis on a frequency domain is utilized to reveal an essential attribute of oscillation of a multi-loop control system, so that a fluctuation source of the oscillation is determined; and thus, it is beneficial for a factory engineer to carry out follow-up maintenance and repairing work of a fault circuit.

Description

technical field [0001] The invention relates to the field of system performance evaluation, fault detection and diagnosis in process industry, in particular to a novel method for locating a wave source of multi-loop oscillation in process industry. Background technique [0002] The process industry is not only a generator of energy and various raw materials, but also a major consumer of energy. Energy saving and consumption reduction are very important. In addition to being restricted by the performance of the equipment itself, the comprehensive performance of the process industry depends to a large extent on the performance of the control system that makes the equipment and devices operate normally. Changes in technology objects, control parameters, sensors and actuator characteristics. The process characteristics of the production equipment itself will gradually change with the operation time, and the equipment characteristics will also change with the process transformat...

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Problems solved by technology

[0006] The purpose of the present invention is to provide a novel process industry multi-loop oscillation fluctuation source location method in order to overcome the above-mentioned defects in the prior art. This method reveals the essential properties of the multi-loop control system oscillation through signal analysis in the frequency domain, and determines Oscillating fluctuation source, which is beneficial for factory engineers to carry out subsequent maintenance and repair of faulty loops, and provides a new and reliable way to solve the problem of device-level multi-loop performance degradation

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