Fluctuation source localization method of multi-loop oscillation of novel process industry

Abstract

The invention relates to a fluctuation source localization method of multi-loop oscillation of a novel process industry. According to the method, a frequency domain independent component analysis (ICA) is employed to carry out independent component decomposition on industry historical process data; a variable quantity that plays a leading role in fluctuation oscillation and a dominant frequency can be screened; a local directed coherence analysis is carried out on the screened data; and a cause-and-effect relationship graph is used to visually express a cause-and-effect relationship between loop variables, so that a propagation path of a fluctuation interference can be characterized; process priori knowledge is used to simplify the cause-and-effect relationship graph as well as a threshold automatic searching mode is utilized to filter a secondary cause-and-effect relationship branch, so that a main propagation path of fluctuation is obtained and thus a fluctuation source is localized and identified. Compared with the prior art, the technology employed in the invention enables the method to have the following beneficial effects: a signal analysis on a frequency domain is utilized to reveal an essential attribute of oscillation of a multi-loop control system, so that a fluctuation source of the oscillation is determined; and thus, it is beneficial for a factory engineer to carry out follow-up maintenance and repairing work of a fault circuit.

Description

technical field [0001] The invention relates to the field of performance evaluation, fault detection and diagnosis of process industry systems, and in particular to a novel process industry multi-loop oscillation fluctuation source positioning method. Background technique [0002] The process industry is not only a producer of energy and various raw materials, but also a major consumer of energy, so energy saving and consumption reduction are very important. In addition to being restricted by the performance of the equipment itself, the overall performance of the process industry depends to a large extent on the performance of the control system that enables the normal operation of equipment and devices. However, the control performance of the basic loop in the process industry is not fixed and will change with the The process object, control parameters, sensor and actuator characteristics change. The process characteristics of the production device itself will gradually ch...

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Problems solved by technology

[0006] The purpose of the present invention is to provide a novel process industry multi-loop oscillation fluctuation source location method in order to overcome the above-mentioned defects in the prior art. This method reveals the essential properties of the multi-loop control system oscillation through signal analysis in the frequency domain, and determines Oscillating fluctuation source, which is beneficial for factory engineers to carry out subsequent maintenance and repair of faulty loops, and provides a new and reliable way to solve the problem of device-level multi-loop performance degradation

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