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Array substrate, manufacturing method thereof and liquid crystal panel

An array substrate, test control technology, applied in the field of array substrate and its manufacturing method, thin film transistor liquid crystal display

Active Publication Date: 2012-07-04
BOE TECH GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Embodiments of the present invention provide an array substrate and its manufacturing method, and a liquid crystal panel, so as to solve the problem in the prior art that it is difficult to perform array testing on an array substrate containing a GOA circuit

Method used

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  • Array substrate, manufacturing method thereof and liquid crystal panel
  • Array substrate, manufacturing method thereof and liquid crystal panel
  • Array substrate, manufacturing method thereof and liquid crystal panel

Examples

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Embodiment Construction

[0032] The array substrate, the manufacturing method thereof, and the liquid crystal panel according to the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0033] It should be clear that the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0034] Such as image 3 Shown is a schematic structural diagram of an embodiment of the array substrate of the present invention. The array substrate includes a grid line 2b, a grid line test line 2c, a grid line test terminal 2G1 and 2G2, and a GOA circuit 11. The GOA circuit 11 is connected to each grid line 2b, and each grid line test line 2c is connected to a grid line respectively. The line test terminal is connec...

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PUM

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Abstract

The invention discloses an array substrate, a manufacturing method thereof and a liquid crystal panel, relates to the technical field of liquid crystal display, and aims to solve the problem of difficulty in performing array test on an array substrate comprising a GOA (Gate On Array) circuit in the prior art. The array substrate comprises a grid line, a grid line test line, a grid line test terminal and a GOA circuit, wherein the GOA circuit is connected with the grid line; the grid line test line is connected with the grid line test terminal; the array substrate is characterized by also comprising a grid line test control terminal, a grid line test control line and a plurality of test liquid crystal transistor TFTs (Thin Film Transistor); the grid line test control terminal is connected with the grid line test control line; and a grid electrode of each test TFT is connected with the grid line test control line, a drain electrode of each test TFT is connected with one said grid line, and a source electrode of each test TFT is connected with the grid line test line. The array substrate can be used for performing array test on the array substrate comprising the GOA circuit.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to an array substrate, a manufacturing method thereof, and a thin film transistor liquid crystal display. Background technique [0002] The liquid crystal panel of a thin film transistor liquid crystal display includes an array substrate and a color filter substrate. In the manufacturing process of a thin film transistor liquid crystal display, the array substrate and the color filter substrate can be separately manufactured, and then the array substrate and the color filter substrate are boxed and filled with liquid crystals, so that A liquid crystal panel is formed. Among them, before the box is assembled, the array substrate must be tested first, and the array substrate that passes the test can enter the box-fitting workshop for further processing, and the array substrate that fails the test needs to be repaired. [0003] In order to perform an array test on the a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/1362G02F1/1368H01L27/12H01L21/77
Inventor 孙阳黄应龙吕敬
Owner BOE TECH GRP CO LTD
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