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Protective device for preventing packaged sample from being damaged by static electricity

A protection device, electrostatic damage technology, applied in circuits, electrical components, electrical solid devices, etc., can solve the problems of being easily damaged by static electricity, high sample failure rate, increase reliability test cost and reliability, etc. rate effect

Inactive Publication Date: 2012-07-18
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is used to solve the reliability test of devices in the prior art, which is easily damaged by static electricity during packaging and subsequent storage and use, resulting in high sample failure rate and seriously increasing the cost and reliability of reliability testing

Method used

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  • Protective device for preventing packaged sample from being damaged by static electricity
  • Protective device for preventing packaged sample from being damaged by static electricity
  • Protective device for preventing packaged sample from being damaged by static electricity

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Embodiment Construction

[0022] In order to make the technical means, creative features, objectives and effects of the invention easy to understand, the present invention will be further elaborated below in conjunction with specific diagrams.

[0023] Such as figure 2 , 3 As shown, in a specific embodiment of the present invention, a protective device for preventing packaged samples from being damaged by static electricity includes: a cover 5, wherein an opening 7 is provided in the center of the cover 5, and the cover 5 has two The side is folded down to form a set foot 6 , and the cover 5 is used to cover the upper surface of the package base 2 . Further, a chip 3 is provided at the center of the upper surface of the package base 2 here, and a plurality of pins 4 are erected on both sides of the package base 2 downwards, and the distance between each pin 4 is equal.

[0024] Further, the opening 7 provided on the cover 5 is vertically aligned with the position of the chip 3 on the base, and the ...

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PUM

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Abstract

The invention discloses a protective device for preventing a packaged sample from being damaged by static electricity. The protective device comprises a sleeve cover, wherein an open pore is formed in the center of the sleeve cover, two sides of the sleeve cover are downwards bent to form sleeve feet, and the sleeve cover is used for covering the upper surface of a packaging base. According to the protective device for preventing the packaged sample from being damaged by the static electricity, the generation of static electricity in a detected sample is effectively inhibited; and meanwhile, the static electricity generated in the packaging process can be safely introduced outside the packaging substrate, thus the detected sample in a package can be prevented from being damaged by static electricity discharge, and the yield of the packaged sample is increased.

Description

technical field [0001] The invention relates to a protection device, in particular to a protection device for preventing packaging samples from being damaged by static electricity. Background technique [0002] Today, with the rapid rise of high-tech industries such as electronics, communications, and aerospace, electronic products such as electronic instruments and equipment are increasingly miniaturized, multi-functional and intelligent. High-density integrated circuits have become an indispensable device for the above-mentioned requirements in the electronics industry. This device has the characteristics of short line spacing, thin line, high integration, fast operation speed, low power and high input impedance. As a result, such devices are becoming more and more sensitive to static electricity. [0003] In our country, the loss caused by static electricity is also very serious. People have been fully aware of the harm that static electricity brings to electronic devi...

Claims

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Application Information

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IPC IPC(8): H01L23/60
Inventor 尹彬锋王炯赵敏
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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