Capacitive screen comprehensive testing circuit, testing method and output data switching algorithm of testing method

A comprehensive testing, capacitive screen technology, applied in the direction of electrical digital data processing, data processing input/output process, calculation, etc., can solve the problems of increasing time cost, unfavorable cost control, reducing production efficiency, etc., to save equipment cost, The effect of improving R&D and production efficiency, saving labor and time costs

Active Publication Date: 2012-10-31
浙江联信康科技有限公司
View PDF8 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In this way, the firmware to be used in each link is different, and the test equipment required is also different, which increases costs, reduces efficiency, and is not conducive to cost control.
[

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitive screen comprehensive testing circuit, testing method and output data switching algorithm of testing method
  • Capacitive screen comprehensive testing circuit, testing method and output data switching algorithm of testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] Below in conjunction with accompanying drawing and embodiment the present invention is further described. see figure 1 , capacitive screen comprehensive test circuit, including: main control chip (Control IC) 1, USB-to-Serial communication chip (USB-to-Serial IC) 2, DIP switch (DIP Switch) 3, adapter board 4; main control chip The output terminal of 1 is respectively connected to the input terminal of the USB to serial communication chip 2 and the dial switch 3, the main control chip 1 is connected to the capacitive touch screen 5 through the adapter board 4, and the output terminal of the USB to serial communication chip 2 is connected to the computer The input terminal of the serial communication port 6 is connected with the test software 7 through the computer serial communication port 6 .

[0033] Main control chip (Control IC) 1: includes I2C communication module and UART communication module; it can be used as an I2C Master device to read and write data to the CT...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a capacitive screen comprehensive testing circuit, a testing method and an output data switching algorithm of the testing method. The capacitive screen comprehensive testing circuit comprises a master control chip, a USB (Universal Serial Bus)-to-serial port chip, a dial switch and an adapter plate, wherein an output end of the master control chip is connected with a USB-to-serial communication chip and an input end of the dial switch respectively; the master control chip is connected with the capacitive touch screen through the adapter plate; an output end of the USB-to-serial communication chip is connected with an input end of a computer serial communication port; and the computer serial communication port is connected with testing software. A set of circuit board device is adopted, a software algorithm is designed in a firmware of CTP (Capacitive Touch Panel), and the two are matched for use, so that the CTPs of various different ports can be connected to perform various different kinds of data analysis test working by using only one set of circuit board device and only one firmware at a research, development and debugging stage, a production testing stage and a repair stage of the CTP.

Description

technical field [0001] The invention relates to a capacitive screen testing technology, in particular to a comprehensive testing circuit, a testing method and an output data switching algorithm in the process of R&D, production and repair of a capacitive screen. Background technique [0002] At present, the research and development of capacitive screens and the actual measurement methods in the production process are usually as follows: [0003] (1) During the research and development process: generally use the test box provided by the main control chip manufacturer to analyze the performance of the capacitive screen and debug the parameters. At this time, it is necessary to burn the control chip of the CTP (capacitive screen) to output each Sensor ( Sensitive element) Raw-data (original capacitance sensing value) data firmware. [0004] (2) In the production process: the function inspection of CTP's FPCA (flexible printed circuit board module) incoming material, the functi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/00G06F3/044
Inventor 赵蓓陈建忠
Owner 浙江联信康科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap