Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Laser processing apparatus

A laser processing and laser beam technology, applied in metal processing, laser welding equipment, metal processing equipment, etc., can solve the problem of difficult to reliably determine the spectrum, and achieve the effect of reliable detection

Active Publication Date: 2012-11-28
DISCO CORP
View PDF11 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] However, since the bonding pad made of metal is located at the bottom of the fine hole formed by irradiation of laser light, there is a problem that even if plasma is generated by irradiation of laser light, it is difficult to reliably determine the inherent nature of the substance emitted by the plasma. spectrum

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Laser processing apparatus
  • Laser processing apparatus
  • Laser processing apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0066] Hereinafter, preferred embodiments of the laser processing apparatus configured according to the present invention will be described in more detail with reference to the drawings.

[0067] figure 1 A perspective view of a laser processing device constructed according to the present invention is shown.figure 1 The shown laser processing apparatus is provided with: a stationary base 2; On the base 2; the laser beam irradiation unit support mechanism 4, which is configured on the stationary base 2 in a manner capable of moving in the indexing feed direction (Y-axis direction) shown by the arrow Y perpendicular to the X-axis direction; And the laser beam irradiation unit 5 is disposed on the laser beam irradiation unit support mechanism 4 so as to be movable in the focusing point position adjustment direction (Z-axis direction) indicated by arrow Z.

[0068] The above-mentioned chuck table mechanism 3 includes: a pair of guide rails 31, 31 arranged in parallel on the stati...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
Login to View More

Abstract

A laser processing apparatus includes a chuck table for holding a workpiece and a laser beam applying unit for applying a laser beam to the workpiece. A laser beam oscillating unit oscillates a laser beam and a focusing unit focuses the laser beam onto the workpiece. A reflecting unit is provided on the optical axis of the focusing unit. A wavelength detecting unit detects the wavelength of the plasma light reflected by the reflecting unit, and a controller determines the material of the workpiece according to a detection signal from the wavelength detecting unit, to control the laser beam applying unit.

Description

technical field [0001] The present invention relates to a laser processing device for forming a laser processing hole in a workpiece such as a semiconductor wafer. Background technique [0002] In the manufacturing process of semiconductor devices, a plurality of regions are divided on the surface of a roughly disc-shaped semiconductor wafer by dividing lines called streets arranged in a grid, and ICs, LSI and other devices. Then, the semiconductor wafer is cut along the lanes, whereby the regions where the devices are formed are divided to manufacture individual semiconductor chips. [0003] In order to achieve miniaturization and high functionality of devices, a module structure in which a plurality of devices are stacked and bonding pads provided on the stacked devices are connected has been put into practical use. The structure of this module structure is to form a through hole (through hole) in the position where the bonding pad is provided on the semiconductor wafer,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B23K26/36B23K26/42B23K26/06B23K26/04B23K26/00
CPCB23K26/063B23K26/0643B23K26/0861B23K26/381B23K26/0876B23K26/032B23K26/4075B23K2201/40B23K26/0622B23K26/382B23K26/40B23K2101/40B23K2103/50
Inventor 能丸圭司森数洋司西野曜子
Owner DISCO CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products