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Cotton highly-verticillium wilt resistant major QTL (quantitative trait locus) and SSR molecular marker thereof

A technology of molecular markers and Verticillium wilt resistance, applied in the field of crop genetics and breeding, can solve problems such as difficulty, high cost, and long time

Active Publication Date: 2013-02-13
NANJING AGRICULTURAL UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to improve the Verticillium wilt resistance level of the existing upland cotton varieties in my country, firstly, the germplasm lines with high resistance to Verticillium wilt should be collected as parents, and a series of crosses and backcrosses should be carried out with the existing high-yield promotion varieties. Verticillium wilt resistance must be tested, which is costly and takes a relatively long time. At the same time, the resistance identification is also easily affected by environmental factors such as temperature and humidity.
Therefore, disease-resistant breeding takes a long time, costs high, and is relatively difficult

Method used

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  • Cotton highly-verticillium wilt resistant major QTL (quantitative trait locus) and SSR molecular marker thereof
  • Cotton highly-verticillium wilt resistant major QTL (quantitative trait locus) and SSR molecular marker thereof
  • Cotton highly-verticillium wilt resistant major QTL (quantitative trait locus) and SSR molecular marker thereof

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Experimental program
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Embodiment 1

[0038] f 2 Population preparation: In the summer of 2005, a hybrid combination was prepared with Prema as the female parent and 86-1 as the male parent to obtain F 1 , F 1 The seeds were multiplied in the south in the same year and self-crossed to get F 2 Seeds, planted in spring 2006 F 2 , F 2:3 seed.

[0039] Preparation of recombinant inbred line population: In the winter of 2006, the above-mentioned F 2:3 planted in the field, and self-crossed as a single plant to produce F 4For generation seeds, one selfed boll was collected from each plant in each family, and after mixing, it was selfed in Jiangpu Base, Nanjing in the spring of 2007 to produce F 5 Generation of seeds, the harvest is to randomly select a single plant in each row, harvest all the selfed bolls of the single plant, and produce F 6 Generation seeds, planted F 6 , harvest the seeds by row, and build the F of the combination 7 Generation of recombinant inbred lines population, will be obtained in the s...

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Abstract

The invention discloses a cotton highly-verticillium wilt resistant major QTL (quantitative trait locus) and an SSR molecular marker thereof. The cotton highly-verticillium wilt resistant major QTL is located on the cotton D9 chromosome, 16.95-65.53% of phenotypic variation can be explained in the RIL (recombinant inbred line) colony from the highly-verticillium wilt resistant germplasm systems Prema and 86-1, and the following three SSR markers are in close linkage therewith: SSR / NAU2954209, SSR / NAU3414258 and SR / DPL0530220. The molecular marker disclosed by the invention is used for screening or identifying the verticillium wilt-resistant cotton variety. The invention is favorable for solving the problem of slow progress of the cotton verticillium wilt resistance breeding of the country, and is favorable for overcoming the defects of high cost, long time, low stability and the like of the existing breeding technology in verticillium wilt resistance identification; and the highly-verticillium wilt resistant cotton new variety breeding and seed industrialization progresses of the country are greatly accelerated.

Description

technical field [0001] The invention belongs to the field of crop genetics and breeding, and relates to a main effect QTL with high cotton resistance to Verticillium wilt and an SSR molecular marker thereof. Background technique [0002] Cotton fiber is an important raw material for the textile industry, and cotton verticillium wilt is one of the most harmful worldwide diseases to cotton. When cotton verticillium wilt was introduced into the American cotton variety in 1935, it spread to my country with the seeds and spread rapidly It has spread all over the major cotton producing areas in my country. In 1993, Verticillium wilt of cotton broke out in my country, and the national disease area reached 267hm 2 , loss of 100,000 tons of lint (Shi Leiyan, Research Progress on Verticillium Wilt of Cotton in my country, Acta Cotton Sinica, 1995, 7(4): 243-245). In 2002 and 2003, it broke out again in the Yellow River Basin and Xinjiang cotton area, and cotton Verticillium wilt has ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C12N15/11C12Q1/68
Inventor 张天真宁志怨郭旺珍
Owner NANJING AGRICULTURAL UNIVERSITY
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