Method and system for measuring short-time flicker

Abstract

The invention discloses a method and a system for measuring short-time flicker. The method comprises the following steps of: obtaining instantaneous flicker values within a preset time; classifying the instantaneous flicker values, wherein each grade corresponds to one values of the instantaneous flicker values; recording the number of the instantaneous flicker values under each grade; according to the grade and the number of the instantaneous flicker values under each grade, confirming the five instantaneous flicker values which are just less than 0.1%, 1%, 3%, 10% and 50% in all the instantaneous flicker values; and computing the short-time flicker within the preset time according to a formula. After the method or the system provided by the invention is adopted, the data size which needs to be stored in the process of computation can be reduced, the computation process of the short-time flicker can be supported by a mini type computation system, the computation process can be simplified, and the short-time flicker value can be timely obtained.

Description

technical field [0001] The invention relates to the field of power systems, in particular to a method and system for measuring short-term flicker. Background technique [0002] The human eye's visual response to voltage fluctuations that cause unstable light illuminance (light flickering) is called flicker. In other words, flicker reflects the impact of flickering lights caused by voltage fluctuations on human vision. Short term flicker value (short term severity, Pst) is a statistical value to measure the strength of flicker in a short time (several minutes). Usually, Pst=1 is the limit value of visual stimulation caused by flicker. Since short-term flicker is the result of voltage fluctuations in a short period of time, measuring short-term flicker can obtain voltage fluctuations within a corresponding period of time. [0003] It should be noted that voltage flicker is different from common voltage fluctuations. First of all, voltage flicker refers to a rapid rise and ...

AI Technical Summary

Problems solved by technology

Taking sampling for 10 minutes and sampling 400 times per second as an example, the amount of data to be stored in the method in the prior art is very large, reaching (1.2*10*60*400=288000 words), resulting in a small computing system (such as a single-chip microcomputer) The data storage space is not enough to support the entire short-term flicker measurement process

And in the prior art, also need to carry out figure 1 The data in the process is processed in segments, and a large number of comparative statistical calculations are performed, and it is also necessary to pass figure 1 The calculation result of figure 2 , and finally get the CPF 0.1 ,CPF 1 ,CPF 3 ,CPF 10 ,CPF 50 The corresponding S(p.u.), the corresponding relationship is complicated, and the amount of calculation is large, which leads to a long calculation time, and it is impossible to obtain the short-term flicker value in real time

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