Three-step sign test method combined with odd-even check

Abstract

The invention relates to a three-step sign test method combined with odd-even check. Test steps of the three-step sign test method combined with the odd-even check comprise that step 1, the corresponding boolean expression of a circuit is read from a text; step 2, the boolean expression is analyzed to generate corresponding intermediate data and the odd-even check is conducted; step 3 based on a foundation of the odd-even check, a first step sign test judgment, a second step sign test and a third step sign test judgment are conducted according to the intermediate data correspondingly generated; step 4, a test result is recorded in a textual mode. The three-step sign test method combined with the odd-even check has the advantages of improving test efficiency and a failure coverage rate of the sign test simultaneously and enabling a former circuit not capable of testing a sign to be capable of conducting the sign test. The three-step sign test method combined with the odd-even check brings in the odd-even test based on a traditional sign test in the first place, preprocesses the circuit being tested, improves test efficiency, conducts further sublimation process on the sign test to form the second step sign test and the third step sign test, and improves the failure coverage rate of the test.

Description

technical field [0001] The invention relates to the field of computer hardware fault testing, in particular to the field of fixed fault diagnosis algorithms based on exhaustive testing, and proposes a third-order symptom testing method combined with parity checks. [0002] Background technique [0003] Basic knowledge introduction: [0004] Symptom testing, parity checking is a well-known exhaustive testing based fixed fault diagnosis algorithm that has been used for many years. The exhaustive test method needs to test all possible combinations of a circuit, that is, for a circuit with n input variables, it is to combine all 2 n All input combinations are loaded on the circuit, and then the output response is used to determine whether the circuit is normal. One of the advantages of the exhaustive test method is that it can make more reliable test results for any circuit without knowing the specific design of the circuit. The symptom test has inherited this advantag...

AI Technical Summary

Problems solved by technology

[0028] With the development of VLSI, the design of circuits has become more and more complex, and the fault testing of circuits has become more and more complicated. Now some fault diagnosis is facing more and more problems, especially It is the issue of time overhead and storage overhead that plagues most fault testing practitioners

In order to adapt to the development of VLSI in the new era, it is necessary to improve the existing fault testing methods so that there is less time and less resources to test more complex circuits

However, in some commercial circuits, especially military ones, some information has a certain degree of confidentiality, and it is even more difficult to detect faults in the circuit.

[0029] At the same time, due to the completeness of the symptom test, it is difficult to guarantee the fault coverage in response to the rapid development of large-scale integrated circuits at this stage

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