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Measuring method for distribution coefficient of zircon microelement and zircon magma microelement

A technology of trace elements and distribution coefficients, applied in measuring devices, analyzing materials, and analyzing materials through electromagnetic means, can solve problems such as uncertainties and achieve the effect of improving accuracy

Inactive Publication Date: 2013-04-03
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, it is difficult for traditional measurement methods to erode a certain ring zone, which also brings uncertainty to the results.

Method used

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  • Measuring method for distribution coefficient of zircon microelement and zircon magma microelement
  • Measuring method for distribution coefficient of zircon microelement and zircon magma microelement
  • Measuring method for distribution coefficient of zircon microelement and zircon magma microelement

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Embodiment Construction

[0028] In order to solve the above problems, the present invention discloses a method for measuring the distribution coefficient of zircon trace elements and zircon / magma trace elements. This method is mainly divided into two steps: the first step, the laser or an ion beam scans the sample surface to obtain trace element and base element image ( Figure 4 ) The second step is to determine the analysis position through the acquired image information of trace elements, and deflect the laser beam or the primary ion beam to the selected analysis position. The measurement of the trace element content in the non-scanning mode includes the measurement of the trace element content of zircon and the measurement of the trace element content of magma glass. The specific process is as follows:

[0029] (1) Use laser or primary ion source, the primary ion source can be oxygen ion source or other ion source. The ions ionized by the laser or the ion source are focused on the surface of the...

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Abstract

The invention discloses a measuring method for a distribution coefficient of a zircon microelement and a zircon magma microelement. The method comprises the steps of scanning the surface of a sample through a laser beam or a primary ion beam to obtain images of microelements and background elements, determining an analysis position through obtained image information of the microelements, deflecting the laser beam or the primary ion beam to the selected analysis position, and measuring the content of the zircon microelement and the content of the magma glass microelement in a non-scanning mode.

Description

technical field [0001] The invention relates to a zircon trace element and a zircon / magma trace element distribution coefficient measuring method. Background technique [0002] Zircon is the most common accessory mineral in nature and widely exists in igneous rocks, metamorphic rocks and sedimentary rocks. Due to its extremely stable physical and chemical properties, it can be preserved in the process of magma, metamorphism and erosion that destroys most other common minerals, and then becomes an important basis for studying geological processes. Zircon often contains various trace elements such as lithophile elements Sc, Y, rare earth elements, Ti, Hf, Th, U, Nb, Ta, V and P elements. Through the determination of the trace elements in zircon and the distribution coefficient of zircon / magma trace elements, the temperature, pressure and composition of magma at the time of zircon formation can be determined, and then the composition and evolution of the crust can be studied. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/64
Inventor 郝佳龙杨蔚张建超林杨挺
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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