Sensor measuring method based on double support vector machines

A dual support vector machine and support vector machine technology, which is applied to instruments, computer parts, characters and pattern recognition, etc., can solve the problems of fitting the inverse characteristics of sensors, measurement errors, etc., and achieves small modeling workload and fast calculation. Effect

Inactive Publication Date: 2013-05-01
XUZHOU UNIV OF TECH
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Problems solved by technology

[0005] Due to the high nonlinearity of the input and output characteristics of the sensor, the inverse modeling based on the support vector machine cannot fit the inverse characteristics of the sensor with high precision, and there are still considerable measurement errors in this method

Method used

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  • Sensor measuring method based on double support vector machines
  • Sensor measuring method based on double support vector machines
  • Sensor measuring method based on double support vector machines

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Embodiment Construction

[0030] Such as figure 1 As shown, a sensor measurement method based on dual support vector machines uses sensor calibration data to establish data samples, and uses support vector machines to construct the sensor inverse model and error model respectively. The parameters of the two support vector machine models are optimized by quantum particle swarm The root mean square error and the maximum absolute error of the algorithm and model are selected and optimized, and the difference between the output of the inverse model of the sensor and the output of the error model is used as the true value of the measured value to realize the effective compensation of the nonlinear characteristics of the sensor and achieve The purpose of measuring the measurand with high precision.

[0031] In this embodiment, a temperature sensor is used to illustrate the method, and both the inverse model and the error model of the sensor are selected and optimized using the quantum particle swarm optimiza...

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Abstract

The invention discloses a sensor measuring method based on double support vector machines, belonging to the field of sensor information processing. The method comprises the following steps: establishing a data sample by sensor calibration data under the working condition environment; constructing a sensor inverse model based on the support vector machines by applying the data sample; establishing a second data sample by applying error data of sensor output and sensor inverse model output to construct an error model based on the support vector machines; selecting and optimizing the parameters of the sensor inverse model and the error model through a quantum-behaved particle swarm optimization algorithm, as well as minimum standards of root-mean-square error of the model and maximum absolute error; and taking the difference of the sensor inverse model output and the error model output as a measured true valve. The sensor measuring method has the advantages that the influence of non-linearity property of the sensor on the measuring result can be effectively lowered; the measured high-precision measurement is realized; the modeling working amount is low; and the sensor measuring method based on the double support vector machines can be widely applied to the field of high-precision measurement of various sensors.

Description

technical field [0001] The invention belongs to the field of sensor information processing, in particular to a sensor measurement method based on dual support vector machines. Background technique [0002] Sensors have been widely used in many fields such as industry, agriculture, national defense, science and technology, and have become the basis of modern information society. Due to the influence of many factors such as the characteristics of sensor sensitive elements, application environment, sensor aging, etc., there is a complex nonlinear relationship between the output and input of the sensor, which brings large measurement errors in practical engineering applications. [0003] At present, the sensor inverse modeling method based on machine learning is an effective technical means to realize the compensation of the nonlinear characteristics of the sensor and improve the measurement accuracy of the sensor. Neural network has strong nonlinear mapping ability and strong ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00G06K9/62
Inventor 黄为勇高玉芹田秀玲
Owner XUZHOU UNIV OF TECH
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