Optical device measuring method and measuring device based on optical single side band modulating

A single-sideband modulation and measurement method technology, which is applied in the direction of measuring devices, optical instrument testing, and machine/structural component testing, can solve problems such as the inability to accurately measure the transfer function of the optical device to be tested, and achieve accurate measurement results. Effect

Active Publication Date: 2013-05-08
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

Therefore, the transfer function of the opti...

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  • Optical device measuring method and measuring device based on optical single side band modulating
  • Optical device measuring method and measuring device based on optical single side band modulating
  • Optical device measuring method and measuring device based on optical single side band modulating

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Embodiment Construction

[0014] The technical scheme of the present invention is described in detail below in conjunction with accompanying drawing:

[0015] The purpose of the present invention is to further improve the existing optical single sideband modulation based on optical single sideband modulation For the measurement accuracy of the device measurement method, the technical solution adopted in the present invention is to divide the optical SSB frequency sweep signal through the optical device to be measured into two paths, filter out the carrier wave of one path and adjust the optical path length of the other path so that The two optical paths are equal in length; finally, the balanced photoelectric detector is used to perform balanced photoelectric detection on the two paths of optical signals to obtain converted electrical signals.

[0016] Optical device measurement device based on optical single sideband modulation of the present invention, such as figure 1 As shown, it includes: an opti...

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Abstract

The invention discloses an optical device measuring method based on optical single side band modulating. The optical device measuring method includes the steps of making improvements on the basis of an optical device measuring technology based on optical single side band modulating in the prior art, dividing optical single side band swept-frequency signals into two paths during photovoltaic conversion, filtering carrier waves of one of the two paths, adjusting the length of optical path of the other path, in the end using a balance photoelectric detector to conduct balance photoelectric detection of two optical signal paths, and obtaining electrical signals after conversion. The invention further discloses an optical device measuring device based on the optical single side band modulating. Compared with the prior art, the optical device measuring method eliminates errors introduced into the measuring results due to beat frequencies of numerous high-order side bands and residual first-order side bands of optical single side band modulating signals through the method of balance photoelectric detection and obtains the measuring results of higher accuracy.

Description

technical field [0001] The invention relates to an optical device measurement method and a measurement device, in particular to an optical device measurement method and a measurement device based on optical single sideband modulation, and belongs to the technical fields of optical device measurement and microwave photonics. Background technique [0002] In recent years, with the rapid development of laser technology, photonic systems have been widely used, such as ultra-high-precision optical fiber sensing, long-distance optical fiber communication, etc. However, the development of optical measurement technology has stagnated, which not only makes it difficult to develop and manufacture high-precision optical devices, but also makes it impossible for existing optical devices to maximize their effectiveness in optical systems. For example: the minimum bandwidth of Fiber Bragg Grating (FBG) is as low as 9MHz, while the measurement accuracy of existing optical measurement techn...

Claims

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Application Information

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IPC IPC(8): G01M11/00
Inventor 潘时龙薛敏唐震宙顾晓文赵永久朱丹郭荣辉
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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