Super-high spectral resolution gas medium wave infrared spectrum measurement system

A spectral resolution, infrared spectroscopy technology, applied in the field of ultra-high spectral resolution gas medium wave infrared spectroscopy measurement system, can solve the problems of complex optical comb control and huge system, and achieve the effect of stable measurement signal

Inactive Publication Date: 2013-05-08
ZHEJIANG UNIV
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  • Abstract
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Problems solved by technology

However, because the control of the optical comb is very complicated, the system structure involves a laser reference and a frequency-locking system composed of multiple optical frequency conversions. The entire system is too large and is currently limited to laboratory applications.

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  • Super-high spectral resolution gas medium wave infrared spectrum measurement system
  • Super-high spectral resolution gas medium wave infrared spectrum measurement system
  • Super-high spectral resolution gas medium wave infrared spectrum measurement system

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Embodiment Construction

[0016] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0017] Such as figure 1 As shown, the ultra-high spectral resolution gas mid-wave infrared spectroscopy measurement system consists of a longitudinal-mode-free broadband mid-wave infrared laser source 1, a gas absorption cell 2 and an ultra-high resolution spectrometer 3; the longitudinal-mode-free broadband mid-wave infrared laser source 1. It directly enters the gas absorption cell 2 through the optical system in space, and after exiting the gas absorption cell 2, enters the ultra-high resolution spectrometer 3 to obtain the gas absorption spectrum to be measured.

[0018] The broadband mid-wave infrared laser light source 1 is a broadband mid-wave infrared laser light source without longitudinal mode characteristics, the spectral half-maximum width is greater than 100nm, the average power is greater than 1 milliwatt, and its waveband is loc...

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Abstract

The invention discloses a super-high spectral resolution gas medium wave infrared spectrum measurement system which is composed of a no-longitudinal mode broadband medium wave infrared laser source, a gas absorption tank and a super-high resolution spectrograph, wherein the no-longitudinal mode broadband medium wave infrared laser source directly spatially enters the gas absorption tank by virtue of an optical system and enters the super-high resolution spectrograph to obtain a to-be-measured gas absorption spectrum after exiting from the gas absorption tank. By adopting the no-longitudinal mode broadband medium wave infrared laser source, an incident light source has the characteristics that spectral components are continuous and spectrum is stable among different laser pulses, and spectrum measurement of the super-high resolution spectrograph can not be affected by mode jump. Therefore, the super-high spectral resolution gas medium wave infrared spectrum measurement system has sky-high spectral resolution, can be used for measuring slight change of the gas absorption spectrum, and is suitable for measurement of a trace gas.

Description

technical field [0001] The invention relates to a mid-wave infrared spectrum measurement system, in particular to a gas mid-wave infrared spectrum measurement system with ultra-high spectral resolution. Background technique [0002] The mid-wave infrared band is the characteristic absorption band of many gas molecules. In this band, the corresponding gas absorption peak has high sharpness and large absorption coefficient, so it has the characteristics of high measurement sensitivity and low mutual interference. It is an ideal band for the measurement of trace gas components. . [0003] In the mid-wave infrared band, the characteristic absorption peaks of various gases are arranged according to the wavelength distribution. Therefore, if the high-resolution spectral measurement of a wide spectral range can be quickly realized, it is expected to realize the real-time and accurate measurement of various trace gas components. [0004] At present, the main technical means for rea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/35G01N21/01G01N21/3504
Inventor 沈永行吴波姜培培陈滔杨丁中
Owner ZHEJIANG UNIV
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