Data collection system

A data acquisition system and voltage sampling technology, applied in the direction of physical parameter compensation/prevention, etc., can solve the problems of ADC data conversion error, serious impact, etc.

Inactive Publication Date: 2013-06-19
LUOYANG TIANSHU PHOTOELECTRIC TECH
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Problems solved by technology

[0005] When the resolution of the ADC is 12 bits and the input voltage range is 0-1.2V, the highest resolution of the ADC is 0.293mV. Obviously, the temperature drift of the voltage reference source ΔV REF Relative to the highest resolution of the ADC, it cannot be ignored, and it will inevitably lead to errors in ADC data conversion
For higher resolution ADCs, the impact of voltage reference temperature drift on measurement results is more serious

Method used

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Embodiment Construction

[0030] In order to further explain the technical means and effects that the present invention adopts to achieve the intended purpose of the invention, below in conjunction with the accompanying drawings and preferred embodiments, the specific implementation, structure, features and effects of the data acquisition system proposed according to the present invention, Details are as follows.

[0031] The data acquisition system of the present invention is as attached figure 1 Shown, including: ADuC7060 chip. ADuC7060 chip is ARM7 processor of Analog Devices Company. The invention utilizes the ADuC7060 chip to form a high-precision data acquisition system with 24-bit resolution.

[0032] The ADC0 to ADC9 pins of the ADuC7060 chip are the analog signal input terminals, and the ADuC7060 chip outputs the voltage sampling quantity.

[0033] The voltage reference source integrated in the ADuC7060 chip can be used as a voltage reference source for analog-to-digital conversion. The vol...

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Abstract

The invention relates to a data collection system comprising an AduC7060 chip. Base pins, with numbers from ADC0 to ADC9, of the chip are input ends of analog signals and the chip outputs voltage sampling quantity; a voltage reference source arranged in an integrated mode inside the chip is used as a voltage reference source of analog-digital conversion, and a temperature sensor arranged in an integrated mode inside the chip is used for measuring current temperature of the chip; the chip compensates output voltage sampling quantity according to measured current temperature; and the chip is connected with a serial port and exchanges information with an upper computer through the serial port. According to the technical scheme, accuracy of the analog-digital conversion of the data collection system can be improved effectively and the data collection system is quite practical.

Description

technical field [0001] The invention relates to analog-to-digital conversion technology, in particular to a data acquisition system based on analog-to-digital conversion. Background technique [0002] The data acquisition system is a device that uses an analog-to-digital converter (Analog to Digital Converter, ADC) to convert the analog signal transmitted by the sensor into a digital signal. [0003] The inventor found in the process of implementing the present invention that: the conversion accuracy of the ADC in the data acquisition system is closely related to the reference signal provided by the voltage reference source. In practical applications, the output of various voltage reference sources will drift with the change of chip temperature, especially for low-cost voltage reference sources, the temperature drift phenomenon is more serious. The temperature drift of the voltage reference source will cause a deviation in the reference voltage of the ADC, and the deviation...

Claims

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Application Information

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IPC IPC(8): H03M1/06
Inventor 刘伟耿全领
Owner LUOYANG TIANSHU PHOTOELECTRIC TECH
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