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System and method for extracting measurement element

An element extraction and measurement technology, applied in the field of measurement systems, can solve the problems of increasing the operation burden, affecting the measurement efficiency, and complicated operation steps, so as to reduce the measurement burden and simplify the measurement process.

Inactive Publication Date: 2013-06-26
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, in today's graphic design processing software, if you want to perform measurement operations, the operation methods are similar, and the operation steps are too cumbersome. The shortcomings are mainly reflected in the following three aspects: (1) The measurement range needs to be determined by the user, for example , when measuring the contour (line segment, circle) of the surface, in order to make the measurement result as accurate as possible, the user needs to step on the edge of the contour very carefully to make the fitting result closer to the target measurement elements, which not only increases the burden on the user's operation, but also the measurement results are not accurate enough; (2) The measurement data (that is, the point set) required each time needs to be manually collected by the user one by one, which makes the operation process quite cumbersome. And it takes a lot of time, which greatly affects the measurement efficiency; (3) The system cannot automatically identify the measurement element type, which further increases the user's operational burden, and once the wrong measurement type is selected, the user has to start again. Manual stepping, which caused a lot of trouble for users

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Embodiment Construction

[0020] Such as figure 1 Shown is a schematic diagram of the operating environment of the measurement element extraction system in a preferred embodiment of the present invention. The measurement element extraction system 1 runs in an electronic device 100 , and the electronic device 100 includes a storage device 2 , at least one processor 3 and a display device 4 .

[0021] In this embodiment, the measurement element extraction system 1 is installed in the storage device 2 in the form of software programs or instructions, and is executed by the processor 3 . The measurement element extraction system 1 can identify the measurement element to be extracted by the user according to the surface and the selected point selected by the user from the design file of the workpiece, and identify the measurement type of the measurement element, and according to the quantity The measurement type and related attribute parameters of the measurement element are used to extract the measurement...

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Abstract

The invention provides a measurement element extracting method which includes: selecting a point on an element extracting interface according to a measurement element to be extracted, and selecting a curved surface related to the measurement element; calculating minimum distance between the selected point and a contour line of the curved surface; comparing the minimum distance with a preset first tolerance so as to distinguish that the measurement element to be extracted is the curved surface or the contour line of the curved surface, and distinguishing a measurement type of the measurement element according to a point set of the measurement element; selecting points on the measurement element according to the measurement type of the measurement element and attribute parameters of the measurement element in sampling mode; and outputting the points selected in sampling mode. The invention further provides a measurement element extraction system. The system and method for extracting the measurement element can extract required measurement elements from a design drawing file of a workpiece rapidly.

Description

technical field [0001] The present invention relates to a measurement system and method, in particular to a measurement element extraction system and method. Background technique [0002] When performing measurement operations in graphic design processing software, the simple and convenient measurement of measurement elements can meet the needs of users, which is also the goal that designers have been pursuing relentlessly. [0003] However, in today's graphic design processing software, if you want to perform measurement operations, the operation methods are similar, and the operation steps are too cumbersome. The shortcomings are mainly reflected in the following three aspects: (1) The measurement range needs to be determined by the user, for example , when measuring the contour (line segment, circle) of the surface, in order to make the measurement result as accurate as possible, the user needs to step on the edge of the contour very carefully to make the fitting result c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/46
CPCG06T7/0006G06T2207/10028G06T2207/20101
Inventor 张旨光吴新元杨路
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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