Interface signal quality testing method and system based on special chip

A special-purpose chip and test method technology, applied in the field of network communication, can solve the problems of easy error, rising cost, and increasing manufacturer's input cost, achieving the effect of low cost, meeting test requirements and high accuracy

Active Publication Date: 2013-07-10
SUZHOU CENTEC COMM CO LTD
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AI Technical Summary

Problems solved by technology

However, logic analyzers dedicated to signal testing are expensive, which will undoubtedly increase the manufacturer's input costs, and the frequent use of logic analyzers in the R&D and production stages of switching equipment may easily lead to instrument damage
With the current replacement of sw...

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  • Interface signal quality testing method and system based on special chip
  • Interface signal quality testing method and system based on special chip
  • Interface signal quality testing method and system based on special chip

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Embodiment Construction

[0034] The present invention will be described in detail below in conjunction with specific embodiments shown in the accompanying drawings. But these embodiments do not limit the present invention. Based on the various embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work should be included in the protection scope of the present invention .

[0035] ginseng figure 1 As shown, in a specific embodiment of the present invention, in order to realize the signal quality of the physical interface of low-cost, automatic test exchange chip, the test method based on the interface signal quality of special-purpose chip, it comprises following three steps (S1, S2 , S3), specifically:

[0036] S1. Obtain the signal eye diagram template corresponding to each physical interface on the dedicated chip; wherein, the dedicated function chip of the present invention includes various types of ASIC (Application Specific In...

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Abstract

The invention provides an interface signal quality testing method and an interface signal quality testing system based on a special chip. The method comprises a first step of obtaining signal eye pattern templates corresponding to all physical interfaces on the special chip, a second step of selecting the physical interfaces of the special chip one by one as an object to be tested, starting a signal collecting function of the special chip to collect a plurality of sets of eye height and eye width data corresponding to different time on the physical interface, and drawing a signal eye pattern corresponding to the physical interface according to the plurality of sets of the eye height and eye width data, and a third step of comparing the signal eye pattern of the tested physical interface with the corresponding signal eye pattern template and judging whether a track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template, wherein signal quality is up to predetermined requirements if the track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template and the signal quality is not up to the predetermined requirements if not. The interface signal quality testing system does not need to depend on a signal analyzer or participation of workers, and is high in accuracy, low in cost and capable of meeting testing requirements during mass production of switching equipment.

Description

technical field [0001] The invention relates to the technology in the field of network communication, in particular to an automatic test method and a related system for the quality of an interface signal based on a dedicated chip. Background technique [0002] At present, in the process of R&D and production of switch equipment of data communication equipment manufacturers, it is usually necessary to pay attention to whether the signal quality of the physical interface between the switch chip and other chips meets the requirements, so as to avoid unqualified signal quality of the switch chip on the switch equipment. Affect the basic functions and performance of switch equipment. [0003] In the prior art, in order to verify the signal quality of the physical interface of the chip, equipment manufacturers usually purchase an extremely expensive logic analyzer, and analyze the signal quality through the measurement data of the logic analyzer. However, logic analyzers dedicate...

Claims

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Application Information

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IPC IPC(8): H04L12/26
Inventor 邱建峰梁芳
Owner SUZHOU CENTEC COMM CO LTD
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