Interface signal quality testing method and system based on special chip

Abstract

The invention provides an interface signal quality testing method and an interface signal quality testing system based on a special chip. The method comprises a first step of obtaining signal eye pattern templates corresponding to all physical interfaces on the special chip, a second step of selecting the physical interfaces of the special chip one by one as an object to be tested, starting a signal collecting function of the special chip to collect a plurality of sets of eye height and eye width data corresponding to different time on the physical interface, and drawing a signal eye pattern corresponding to the physical interface according to the plurality of sets of the eye height and eye width data, and a third step of comparing the signal eye pattern of the tested physical interface with the corresponding signal eye pattern template and judging whether a track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template, wherein signal quality is up to predetermined requirements if the track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template and the signal quality is not up to the predetermined requirements if not. The interface signal quality testing system does not need to depend on a signal analyzer or participation of workers, and is high in accuracy, low in cost and capable of meeting testing requirements during mass production of switching equipment.

Description

technical field [0001] The invention relates to the technology in the field of network communication, in particular to an automatic test method and a related system for the quality of an interface signal based on a dedicated chip. Background technique [0002] At present, in the process of R&D and production of switch equipment of data communication equipment manufacturers, it is usually necessary to pay attention to whether the signal quality of the physical interface between the switch chip and other chips meets the requirements, so as to avoid unqualified signal quality of the switch chip on the switch equipment. Affect the basic functions and performance of switch equipment. [0003] In the prior art, in order to verify the signal quality of the physical interface of the chip, equipment manufacturers usually purchase an extremely expensive logic analyzer, and analyze the signal quality through the measurement data of the logic analyzer. However, logic analyzers dedicate...

AI Technical Summary

Problems solved by technology

However, logic analyzers dedicated to signal testing are expensive, which will undoubtedly increase the manufacturer's input costs, and the frequent use of logic analyzers in the R&D and production stages of switching equipment may easily lead to instrument damage

With the current replacement of switching chips and the continuous improvement of the speed of physical interfaces, logic analyzers must also be upgraded accordingly in order to analyze high-frequency signals. Analyzers require manual participation, are prone to errors, and are difficult to meet the needs of mass production of equipment

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