System on Chip Structure and Method for Saving Debugging Information
A system-on-chip and debugging information technology, which is applied in the direction of detecting faulty computer hardware, etc., can solve the problems of occupying a large chip area, increasing production costs, increasing chip pins, etc., to reduce preparation costs, reduce the number of pins, The effect of saving chip area
Active Publication Date: 2017-02-22
MONTAGE TECH CHENGDU CO LTD
View PDF4 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, in the two existing methods, the former method will occupy a large amount of chip area and increase the production cost, and the latter method will increase the number of chip pins, and the debugging speed will also be limited
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0030] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0031] see Figure 1 to Figure 4 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a chip structure of a system-on-chip and a method for storing debug information. The method for storing the debug information includes: firstly, appointing parts of subunits in a storing unit comprised by the chip structure of the system-on-chip to store the debug information; secondly, recording the debug information of the own chip structure of the system-on-chip by a recording unit in the chip structure of the system-on-chip when a processing unit of the chip structure of the system-on-chip executes debug operation; and finally, writing the debug information recorded by the recoding unit into the parts of the subunits by a reading unit of the chip structure of the system-on-chip when the processing unit does not read or write the storing unit. The chip structure of the system-on-chip and the method for storing the debug information have the advantages that no single storer for storing the debug information exists in a storer, and no pin connected with external storer is arranged, so that area of the chip can be effectively saved, and cost can be reduced.
Description
technical field [0001] The invention relates to the field of integrated circuits, in particular to a system-on-chip chip structure and a method for storing debugging information. Background technique [0002] A system-on-chip (SoC chip) is a system chip that includes a processor, DSP, memory, etc., and the system chip can be programmed externally to realize complex system functions. Because SoC can effectively reduce the development cost of electronic / information system products, shorten the development cycle, and improve the competitiveness of products, it will gradually become the most important product development method adopted by the industry. [0003] In order to ensure the quality of SoC chips, usually, R&D personnel or chip manufacturers need to debug the circuits contained in the SoC chips designed or produced by themselves, and obtain information such as bus read and write data, chip internal status, program change process, etc. The debugging information such as t...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 曾旭
Owner MONTAGE TECH CHENGDU CO LTD