Manufacturing method for all-solid lithium secondary battery, and inspection method for all-solid lithium secondary battery
A technology of lithium secondary battery and manufacturing method, applied in secondary battery manufacturing, secondary battery, secondary battery testing, etc.
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no. 1 Embodiment approach )
[0017] Follow the Figure 1 to Figure 4 One embodiment of the present invention will be described.
[0018] figure 1 It is a partial sectional view showing an example of all solid lithium secondary battery 10 . The all-solid lithium secondary battery 10 has a laminated body L composed of a base material 11 and mutually different layers formed on the base material 11 .
[0019] In this embodiment, the shape of the base material 11 is not particularly limited, and may be a plate shape, a sheet shape, a film shape, or a thin plate shape. Moreover, the material of the base material 11 is not specifically limited, Glass, mica, alumina, metal, resin, etc. can be used.
[0020] A positive electrode current collector layer 12 is stacked on a part of the surface of the substrate 11 . The positive electrode current collector layer 12 is conductive and is made of a known material generally used as a current collector. For example, molybdenum (Mo), nickel (Ni), Cr (chromium), Al (alu...
no. 2 Embodiment approach )
[0054] Next, follow Figure 5 A second embodiment of the present invention will be described. In addition, since 2nd Embodiment is a structure which changed only the inspection method of 1st Embodiment, the detailed description of the same part is abbreviate|omitted.
[0055]In the first embodiment, the number of short-circuit defects is predicted, and only one pulse of repair current is supplied, but in the second embodiment, the current value of the repair current is increased stepwise without predicting the number of short-circuit defects, and the short-circuit defects are repaired. That is, the above-mentioned step S17-2 is omitted. Therefore, the thermal imaging device TH and the monitoring unit MN of the inspection system 20 can be omitted, and a normal inspection system for inspecting battery capacity and the like can be used. In addition, in the second embodiment, since the detection of the temperature change by the thermal imaging device TH is not performed, the pac...
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Abstract
Description
Claims
Application Information
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