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A large-aperture aspheric primary mirror detection device and method

A detection device, aspherical technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as difficulty in accurate measurement, and achieve the effects of easy operation, balanced performance, and reduced detection preparation period

Active Publication Date: 2016-05-18
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0017] The invention provides a method for measuring the radius of curvature and the quadratic constant of the vertex of the quadratic aspheric primary mirror. The method skillfully utilizes the baffle plate with the annular slit, which can effectively solve the problem that each distance in the device is difficult to be accurately measured. problems, and the structure is simple and the inspection cost is low

Method used

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  • A large-aperture aspheric primary mirror detection device and method
  • A large-aperture aspheric primary mirror detection device and method
  • A large-aperture aspheric primary mirror detection device and method

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Embodiment Construction

[0037] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0038] like figure 1 Shown is a large-diameter aspheric primary mirror detection device, which includes: a point light source 1, a baffle 2, a scale 3, a measured aspheric primary mirror surface 4, a CCD detector 5, and a filament 6, wherein:

[0039] Place the CCD detector 5, point light source 1, filament 6, baffle plate 2, scale 3, and the mirror surface 4 of the measured aspheric primary mirror in sequence on the optical axis of the measured aspheric primary mirror surface 4, wherein: the scale 3 is tight Attached to the mirror surface 4 of the tested aspheric primary mirror, the body of the baffle 2 has an annular slit 9, and the point light source 1 emits a spherical wave, which is irradiated to the tested aspheric ...

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Abstract

The invention relates to a large-caliber aspheric surface primary mirror detection device and method. The device includes a point light source, a baffle, a measuring scale, a CCD (charge coupled detector) and a thin wire. According to the method, a spherical wave emitted by the point light source passes through an annular seam in the baffle and irradiates the mirror surface of a to-be-detected aspheric surface primary mirror; then the spherical wave is reflected by the mirror surface; the position of the baffle is adjusted, so that the light reflected by the mirror surface of the to-be-detected aspheric surface primary mirror can pass through the annular seam in the baffle; a circle of bright ray is formed at the point light source; the thin wire is used for cutting at the point light source; observing from the back of the thin wire, a user can see that the bright ray disappears; the CCD positioned behind the point light source is used for shooting and recording images of the bright ray; the radius of the annulus of the bright ray and the distance from the light point source to the to-be-detected aspheric surface primary mirror are measured. The position of the point light source or the baffle is adjusted, and the radius of the annulus of the bright ray and the distance from the light point source to the to-be-detected aspheric surface primary mirror are measured, so that the radius of curvature of a vertex of the to-be-detected aspheric surface primary mirror, a secondary constant and a surface shape are figured out according to the aspheric surface primary mirror surface shape formula.

Description

technical field [0001] The invention belongs to the field of advanced optical manufacturing and detection, and relates to an optical detection device, in particular to a large-diameter aspheric primary mirror detection system. Background technique [0002] The main difficulty in the application of aspheric surfaces lies in the processing and testing of aspheric surfaces, especially in the testing process. Since spherical surfaces have a common center of curvature and non-spherical surfaces do not, this brings difficulties to the processing of aspheric surfaces. Although a variety of aspheric surface detection technologies have been developed, there is still no effective measurement method for some forms of aspheric surfaces. Vertex radius of curvature and quadratic constant are two important characteristic parameters of an aspheric surface. Its accurate measurement and control are very important to ensure the reliability of zero inspection of large-aperture aspheric primary ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/255G01B11/00G01B11/24
Inventor 黄传科吴永前
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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