Layout of a MOS Array Edge with Density Gradient Smoothing
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- TAIWAN SEMICON MFG CO LTD
- Publication Date
- 2013-10-30
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Abstract
Description
[0001] This application claims priority to US Provisional Patent Application Serial No. 61 / 640,073, entitled "Layout of a MOS Array Edge with Density Gradient Smoothing," filed April 30, 2012, the contents of which are incorporated herein by reference. technical field
[0002] The present invention relates generally to the field of semiconductors, and more particularly to the layout of the edges of MOS arrays with smooth density gradients. Background technique
[0003] Integrated circuits are typically formed in arrays in which the same metal-oxide-semiconductor (MOS) device geometry is repeated multiple times in a reticle region. The performance of integrated circuits depends on the pattern consistency between the shapes of the functional features within the MOS devices comprising the array to ensure that their electrical characteristics are matched. Because there is a density gradient between the edge of the array and the background circuitry, the pattern consistency of th...