Structured light self-adapting repeated multi-exposure method

A multiple-exposure, self-adaptive technology, applied in the field of 3D measurement, to achieve the effect of reducing redundancy, ensuring quality, and improving real-time performance

Inactive Publication Date: 2013-11-27
SHANGHAI JIAO TONG UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It can effectively overcome the interference of the complex surface of the measured object on structured light fringe imaging, and obtain clear and reliable structured light images without local data loss

Method used

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  • Structured light self-adapting repeated multi-exposure method
  • Structured light self-adapting repeated multi-exposure method
  • Structured light self-adapting repeated multi-exposure method

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Embodiment Construction

[0031] The following is a detailed description of the embodiments of the present invention. This embodiment is implemented on the premise of the technical solution of the present invention, but the protection scope of the present invention is not limited to the following embodiments.

[0032] use as figure 2 The structured light image of the fillet weld surface is acquired in the manner shown. Structured light is laser. The laser 2 emits a line of laser light and irradiates the surface of the weld 3. The CCD camera 1 acquires the structured light fringe image of the weld 3 surface by adaptive multiple exposure method. The fan-shaped light surface emitted by the laser 2 is perpendicular to the rib plate 4 and the bottom plate 5 of the weld 3, and the optical axis of the CCD camera 1 forms an angle α with the fan-shaped light surface of the laser 2. In this embodiment, the angle α is 45 degrees.

[0033] In this embodiment, the adaptive multiple exposure method follows figure...

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Abstract

The invention discloses a structured light self-adapting repeated multi-exposure method in the three-dimensional measuring field. The quality parameters of shot structured light pattern images are used for automatically confirming the exposure time next shooting and judging when shooting is to finish. The concrete method comprises the steps of calculating the quality parameter value of positions on the structured light pattern images, using the quality parameter value of the positions on the structured light pattern images to judge whether the positions reach ideal exposure quality and confirm the exposure time of the next shooting, judging whether shooting finishes through the pixel proportion of the low quality parameters of patterns, and finally conducting data splicing on images of high quality parameters in different exposure time. The method effectively avoids interference of complex conditions of the surface of welding seams on the structured light pattern images, and obtains structured light pattern images which are clear and reliable and do not lack local data so as to improve the accuracy and the stability of three-dimension measurements.

Description

technical field [0001] The invention relates to an image shooting method in the field of three-dimensional measurement, in particular to an adaptive multiple exposure method for improving the quality of structured light image shooting. Background technique [0002] The three-dimensional visual measurement technology based on structured light has the characteristics of non-contact, high detection accuracy and fast dynamic response, so it is widely used in various industries of industrial production. In structured light vision inspection, the structured light image on the surface of the measured object is an information source reflecting the three-dimensional shape of the target object, and the quality of the structured light image is directly related to the reliability and accuracy of the three-dimensional measurement data. However, due to the uneven reflective properties of the surface material of the measured object and the complex contour structure, the thickness of the st...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
Inventor 孙大为黄维蔡艳吴毅雄陶立民汪文忠
Owner SHANGHAI JIAO TONG UNIV
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