Minitype resistance measurement system

A resistance measurement, tiny technology, applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of poor accuracy and low measurement efficiency, achieve low power consumption, improve accuracy, and eliminate resistance temperature. The effect of raising the question

Inactive Publication Date: 2015-07-01
GANSU AGRI UNIV
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to avoid the defects of low measurement efficiency and poor precision in the prior art and provide a tiny resistance measurement system, which effectively solves the problems of the prior art through the close cooperation of the controllable small current source and the high signal-to-noise ratio program-controlled amplifier. existing problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Minitype resistance measurement system
  • Minitype resistance measurement system
  • Minitype resistance measurement system

Examples

Experimental program
Comparison scheme
Effect test

experiment example 2

[0022] Experimental example 2: The above-mentioned micro-resistance measurement system is different from experimental example 1 in that the D / A converter part adopts the scheme of serial 8-bit dual-channel D / A converter MAX518, which can also achieve the same purpose.

experiment example 3

[0023] Experimental example 3: the described a kind of micro-resistance measurement system, differs from experimental example 1 in that the channel selector 106 part adopts an integrated circuit with CD4066 four-way analog switch as the core, and the resistors R16-R19 are respectively selected with a resistance value of 49.45, 12.35, 7.06, 6.20Ω, precision resistor with a power of 0.5W, the magnification of the high signal-to-noise ratio program-controlled amplifier 105 is 1000, 4000, 7000, 8000, a total of 4 options, and the measurement range can also reach about 0.5mΩ- 500Ω purpose.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of low-current source resistance measurement, in particular to a minitype resistance measurement system which comprises a single chip microcomputer. The minitype resistance measurement system is characterized in that a signal a output end of the single chip microcomputer is connected with an input end of a D / A converter, an output end of the D / A converter is connected with an input end of a controllable low-current source, an output end of the controllable low-current source is connected with a tested small resistor, voltage dropping of the tested small resistor is used as output to be connected with an input end of a high-signal-to-noise-ratio programmable amplifier, an output end of the high-signal-to-noise-ratio programmable amplifier is connected with an input end of a low pass filter, an output end of the low pass filter is connected with an A / D converting input end of the single chip microcomputer, a signal b output end of the single chip microcomputer is connected with an address input end of a channel selector, so that different resistance connecting parts are selected to change the magnification times of the high-signal-to-noise-ratio programmable amplifier, through close matching of the controllable low-current source and the high-signal-to-noise-ratio programmable amplifier, the problem of resistance temperature rising in existing high-constant-current-source scheme measuring is avoided, and accuracy of low resistance measurement is improved.

Description

technical field [0001] The invention relates to the technical field of resistance measurement of small current sources, in particular to a tiny resistance measurement system. Background technique [0002] At present, the measurement of tiny resistance has long been a difficulty in electronic measurement. In practical engineering applications, the traditional method is to measure the resistance of the loop by using the DC double-arm bridge method. Although this method has high sensitivity, it is mainly used in laboratory measurements because the current is too weak and must be done manually. In 2003, Li Weibo of Huazhong University of Science and Technology and others proposed a method of measuring resistance with a constant current source, and measuring a small resistance with a DC constant current. The idea is: use a DC constant current to pass through a small resistance, collect data after signal conditioning, and then output show. Since the current of the usual DC cons...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/14
Inventor 王关平高晓阳冯全杨婉霞周蓓蓓杨梅李妙祺李青李红岭
Owner GANSU AGRI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products