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Test data collecting method for distributed real-time test system

A distributed real-time, test system technology, applied in software testing/debugging, resource allocation, multi-programming devices, etc., to achieve the effect of solving test data collection, small data transmission delay, and not easy to memory errors

Active Publication Date: 2014-01-01
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] 1. Purpose: the purpose of the present invention is to provide a distributed real-time test system test data collection method, which can solve the problem of distributed real-time testing without the need to operate a large number of real-time simulation node disks and do not need to occupy network resources for a long time. Problems with test system test data collection

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Embodiment Construction

[0033] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to the drawings and specific embodiments.

[0034] The purpose of the present invention is to provide a method for collecting test data of a distributed real-time test system. This method can solve the problem of distributed real-time test system without requiring a large number of disk operations of real-time simulation nodes or occupying network resources for a long time. Questions about test data collection.

[0035] In order to more clearly introduce the application of this method in a specific embodiment, first, a brief introduction is made to the structure of the system targeted by the embodiment:

[0036] The nodes in the system are divided into two types: main control node and real-time simulation node;

[0037] ●The master control node is responsible for tasks that do not require high re...

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Abstract

A test data collecting method for a distributed real-time test system comprises the following seven steps of (1) applying for a cache region for collecting data in a memory by using nodes, and recording cached addresses, sizes and position index of operation; (2) initializing a collected data cache region of a system; (3) adding labels for first-level caches, and enabling the system to know the current operated cache; (4) transmitting data to the first-level cache of a master control node, and then emptying a second-level cache of a real-time simulated node so that data can be written at the next time; (5) inquiring the first-level caches by using the master control node, reading and writing the data in the first-level caches in second-level caches, and emptying the first-level caches; (6) integrally writing the data in the second-level caches in a magnetic disk of the master control node in the form of binary files by using the master control node when the second-level caches are about to be full; and (7) reading result files from the magnetic disc after the test is stopped, transmitting the result files in a database, dividing the result files into small pieces with the size of 10 MB (mega byte), and storing the result files in the database according to the sequence of a time label.

Description

【Technical field】 [0001] The invention provides a method for collecting test data of a distributed real-time test system, which relates to the test data collection of a real-time test system based on a distributed architecture, and belongs to the technical field of embedded software testing. 【Background technique】 [0002] As the application of embedded systems in aerospace and other fields continues to expand, the testing requirements for embedded software are becoming increasingly urgent. On the one hand, in order to successfully complete the test task, the test system must be able to collect a large amount of data generated during the test process. At the same time, the test system for aerospace and other fields often requires high real-time performance and must be able to be accurate at the specified time point. Accurately complete the scheduled tasks; on the other hand, as the complexity of the embedded system itself becomes stronger and stronger, the ability to accommo...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F9/50
Inventor 杨顺昆刘斌司维
Owner BEIHANG UNIV
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