System calibration method for grating projection three-dimensional measurement

A technology of three-dimensional measurement and system calibration, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low precision, poor operability, and inability to accurately locate the three-dimensional measurement system

Inactive Publication Date: 2014-01-22
SOUTHEAST UNIV
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Problems solved by technology

However, the optical axis and the optical center are imaginary space straight lines and points respectively, which cannot be accurately positioned in practice, and the above conditions are very difficult to meet, so the measurement system is greatly limited in practical applications, and its operability is not strong
At the same time, due to the complicated position calibration process, there will inevitably be errors, so the accuracy of the traditional three-dimensional measurement system is not high

Method used

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  • System calibration method for grating projection three-dimensional measurement
  • System calibration method for grating projection three-dimensional measurement
  • System calibration method for grating projection three-dimensional measurement

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Embodiment Construction

[0051] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. The present invention establishes a calibration model of the system when the projector and the camera satisfy certain positional relationship constraints, and further obtains the calibration parameters by using the standard block and its absolute phase distribution. In the example, a trapezoid containing four squares with known heights is used as the calibration block, such as Figure 4 The trapezoidal object shown in .

[0052] figure 1 It is a flowchart of the whole process of the present invention.

[0053] Calibration is a crucial step in the three-dimensional measurement of grating projection. The existing calibration methods have strict requirements on the positional relationship between the projector and the camera, but these positional constraints are difficult to achieve, which restricts the accuracy of the three-dimensional measure...

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Abstract

The invention relates to a system calibration method for grating stripe projection-based three-dimensional measurement. A calibration object is a system consisting of a projector and a video camera. The method is implemented by the following steps: (1) adjusting the relative positions of the projector and the video camera, so that the projector is parallel with a lens longitudinal axis of the video camera; (2) calculating the absolute phase position of a reference plane by combining a sinusoidal grating phase-shifting algorithm and a Gray code; (3) placing at least two standard blocks, of which the heights are known and different, on the reference plane and calculating the absolute phase position distribution; (4) calibrating a three-dimensional measuring system: establishing projection and imaging models, deducing an object point height-phase position relational expression of an object to be measured, and fitting the coefficients of the height-phase position relational expression by utilizing the standard blocks with known heights and the absolute phase position distribution thereof and through a least square method; (5) calculating the absolute phase position value of the object to be measured and obtaining the height distribution from a calibrated expression so as to realize height measurement of the object. The method has the advantages of high operability and high measuring precision.

Description

technical field [0001] The invention uses a gray-scale sinusoidal grating phase-shift algorithm to obtain the main value phase, and then uses a Gray code method to obtain the fringe order to obtain the absolute phase distribution of the reference plane and the object respectively. Then, the height-phase relationship of the object point is obtained from the positional constraints of the projector and the camera, and then the system is calibrated using a calibration block with a known height, and the coefficients of the height-phase relationship are fitted. Finally, by substituting the pixel coordinates and absolute phase values ​​of each point of the object to be measured into the relational expression, the three-dimensional contour of the object can be measured and the three-dimensional shape of the object can be reconstructed. It belongs to the field of three-dimensional information reconstruction. Background technique [0002] Optical three-dimensional measurement technol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 达飞鹏安冬盖绍彦王辰星
Owner SOUTHEAST UNIV
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