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Method for measuring temperature of target object by using thermal infrared imager

A technology of infrared thermal imager and target object, which is applied in the field of infrared temperature measurement, can solve the problems of difficult temperature measurement and large influence on temperature measurement results, and achieve the effect of accurate temperature

Active Publication Date: 2014-01-22
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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  • Claims
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Problems solved by technology

In the infrared temperature measurement method of the prior art, the temperature measurement result is greatly affected by environmental factors, and it is difficult to achieve accurate temperature measurement

Method used

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  • Method for measuring temperature of target object by using thermal infrared imager
  • Method for measuring temperature of target object by using thermal infrared imager

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Embodiment Construction

[0014] The specific steps of the method for measuring the temperature of a target object with an infrared thermal imaging camera according to an embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

[0015] figure 1 It is a schematic flowchart of a method for measuring the temperature of a target object with an infrared thermal imaging camera according to an embodiment of the present invention. figure 2 It is a schematic diagram of an infrared thermal imager according to an embodiment of the present invention, wherein an infrared thermal imager 6 includes an infrared focal plane array 1 , a temperature sensor 2 , a shutter 3 and an infrared lens 4 . It is easy to understand that the thermal imaging camera 6 also includes other structures, figure 2 The main components of the thermal imaging camera are only schematically shown in . also, figure 2 The bold body 5 is also shown in .

[0016] Refer below figure 1...

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Abstract

The embodiment of the invention discloses a method for measuring the temperature of a target object by using a thermal infrared imager. The method comprises the following steps: calibrating the thermal infrared imager by using black bodies to obtain a temperature-gray level curve of the thermal infrared imager; calculating the tweak parameter of an infrared image by using the gray values of images obtained at different shutter temperatures and black body temperatures of the thermal infrared imager; correcting the infrared image of the target object by using the tweak parameter; performing deformation correction on the infrared image; determining the temperature value of the target object according to the gray value of each pixel point of the corrected infrared image and the temperature-gray level curve. According to the method, the influences of environmental factors on infrared temperature measurement are reduced greatly via the correction, and the temperature of a measured object can be measured accurately.

Description

technical field [0001] The invention relates to the technical field of infrared temperature measurement, in particular to a method for measuring the temperature of a target object with an infrared thermal imager. Background technique [0002] All objects in nature will emit rays as long as their temperature is higher than absolute zero. By detecting and collecting these rays, the required physical quantities can be obtained, such as temperature measurement, object orientation judgment, target recognition, etc. [0003] Infrared temperature measurement technology can realize the rapid measurement of the surface temperature of objects. The accuracy of infrared temperature measurement is affected by the emissivity, reflectivity (or absorptivity) of the measured surface, atmospheric transmittance, atmospheric temperature, ambient temperature and nearby high-temperature objects, etc. Therefore, when performing infrared detection of equipment operating status and object temperatu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/52
Inventor 刘子骥章翔马宣李宵郑兴蒋亚东
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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