Atomic force microscope under-water needle tip bracket applicable to acid/alkali environment

Abstract

The invention discloses an atomic force microscope under-water needle tip bracket applicable to an acid / alkali environment. A groove in the upper surface of a probe fixing disc of the atomic force microscope is a rectangular groove; a probe fixing thread is corrosion-resistant; the probe fixing thread and a transparent sheet are made from a corrosion-resistant material; the elastic probe fixing thread which spans over a lug boss is arranged on the lower surface of the probe fixing disc. The atomic force microscope is structurally characterized in that the front end of the probe fixing thread is inserted into a front through hole of the probe fixing disc; a dowel inserted into the outer end of the front through hole is tightly matched with the end part of the probe fixing thread; the rear end of the probe fixing thread sequentially penetrates through the inner end of a rear through ole of the probe fixing disc, a spring and the inner cavity of a movable pin; a dowel inserted into the outer end of the inner cavity of the movable pin is tightly matched with the end part of the probe fixing thread. By the bracket, an atomic force microscope can be used for performing shape detection in nano size and associated processing experiment on a sample under the acid / alkali environment; due to the fact that the probe fixing thread can be detached and replaced, the using and maintenance cost of the microscope is low; due to the fact that the transparent sheet does not deflect in a using process, the microscopic observation, analysis and processing results are guaranteed to be correct.

Description

technical field [0001] The invention relates to a component of an atomic force microscope, in particular to a component of an environment-controllable atomic force microscope. Background technique [0002] In the field of contemporary science and technology, it is generally believed that nanotechnology, which rose internationally in the late 1980s and early 1990s, is a new technology for the 21st century. Atomic Force Microscopy (AFM) is an important research tool in nanotechnology and plays a vital role. Compared with the traditional optical microscope, the atomic force microscope has three outstanding advantages: high resolution (generally can reach nanometer precision); three-dimensional imaging capability and can directly perform nanoscale processing on the sample surface. [0003] However, with the development of nanotechnology, more and more environmental control requirements have been put forward for atomic force microscopes, and various environmental control systems...

AI Technical Summary

Problems solved by technology

The existing problems are: 1. The glass and the probe fixing line are not corrosion-resistant, and are not suitable for the acid-base liquid phase environment with obvious corrosion characteristics; 2. The circular glass piece fixed in the circular groove by the pressing arm Misalignment will inevitably occur during use, resulting in inaccurate repeated positioning, which will affect microscopic observation and analysis; 3. The probe fixing line is fixed on the probe fixing plate and cannot be disassembled and replaced. When the probe fixing line is damaged due to corrosion or other reasons Then the entire bracket must be replaced, and the maintenance cost is high

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