A submerged needle tip support for atomic force microscopy that can be used in acid-base environments

Abstract

An atomic force microscope submerged needle tip support applicable in acid-base environment, the groove on the upper surface of the probe fixing plate is a rectangular groove, the probe fixing line is made of corrosion-resistant and transparent sheets are made of corrosion-resistant materials; the probe The lower surface of the fixed plate is equipped with an elastic probe fixing line across the boss. The end of the needle fixing line is tightly fitted; the rear end of the probe fixing line penetrates the inner end of the through hole behind the probe fixing plate, the spring and the inner cavity of the movable pin in turn, and the pin inserted into the outer end of the inner cavity of the movable pin is in contact with the probe. The end of the needle retaining thread is a tight fit. The use of this bracket enables the atomic force microscope to perform nanoscale shape detection and related processing experiments on samples in an acid-base environment; and the probe fixing line is detachable and replaceable, and the maintenance cost of the microscope is low; the transparent sheet will not be damaged during use. Misalignment occurs to ensure that the results of microscopic observation, analysis and processing are correct.

Description

technical field [0001] The invention relates to a component of an atomic force microscope, in particular to a component of an environment-controllable atomic force microscope. Background technique [0002] In the field of contemporary science and technology, it is generally believed that nanotechnology, which rose internationally in the late 1980s and early 1990s, is a new technology for the 21st century. Atomic Force Microscopy (AFM) is an important research tool in nanotechnology and plays a vital role. Compared with the traditional optical microscope, the atomic force microscope has three outstanding advantages: high resolution (generally can reach nanometer precision); three-dimensional imaging capability and can directly perform nanoscale processing on the sample surface. [0003] However, with the development of nanotechnology, more and more environmental control requirements have been put forward for atomic force microscopes, and various environmental control systems...

AI Technical Summary

Problems solved by technology

The existing problems are: 1. The glass and the probe fixing line are not corrosion-resistant, and are not suitable for the acid-base liquid phase environment with obvious corrosion characteristics; 2. The circular glass piece fixed in the circular groove by the pressing arm Misalignment will inevitably occur during use, resulting in inaccurate repeated positioning, which will affect microscopic observation and analysis; 3. The probe fixing line is fixed on the probe fixing plate and cannot be disassembled and replaced. When the probe fixing line is damaged due to corrosion or other reasons Then the entire bracket must be replaced, and the maintenance cost is high

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