Mechanical and electrical product reliability growth pre-testing method and device

It is a technology for thorough testing and electromechanical products. It is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc. It can solve the problems of reliability growth, wear and tear, unreasonable reliability tests of electromechanical products, etc., and achieve high precision and accuracy. , good reliability, solve the effect of too long test time

Inactive Publication Date: 2014-01-22
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology

For example: for high-reliability electromechanical products, the test time determined by the exponential distribution timing censored reliability test plan will increase rapidly with the increase of reliability. When the reliability exceeds 0.999, the test time will be more than 1,000 hours. Neither cost nor schedule is desirable
In addition, after such a long test time, individual wearing parts of some electromechanical products have reached the period of severe wear and tear. For products with short task time, the reliability increase at this time is meaningless
[0004] Since the exponential distribution is the most stringent distribution, and the service life of electromechanical products mostly obeys the Weibull distribution, it is unreasonable to copy the reliability test scheme of the exponential distribution to carry out the reliability test of electromechanical products

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  • Mechanical and electrical product reliability growth pre-testing method and device
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  • Mechanical and electrical product reliability growth pre-testing method and device

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Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0028] Since the service life of electromechanical products generally obeys the Weibull distribution, the embodiment of the present invention adopts the Weibull distribution timed censored test scheme to carry out the reliability test, and completes the reliability test of the product within the set time. The embodiment of the present invention conducts research on the application of reliability growth technology for different electromechanical products. First, starting from the failure mechanism of different electromechanical products, the product failure situation is investigated and analyzed, and the existing relevant data of the product is used to adopt Bayesian theory. Determine the shape parameters, count the failure...

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Abstract

The invention discloses a mechanical and electrical product reliability growth pre-testing method. According to the method, reliability of a product can be effectively tested in a short time, and high precision and accuracy are achieved. A mechanical and electrical product reliability growth pre-testing device can carry out reliability growth pre-testing in the mechanical and electrical product reliability growth pre-testing method.

Description

technical field [0001] The invention relates to environment and reliability test technology, in particular to a method and device for testing reliability growth of electromechanical products. Background technique [0002] Product reliability test is one of the important links to evaluate product reliability and life. At present, the reliability tests of my country's military products are mostly formulated with reference to the US military table MIL-STD-781D, and this specification is the procedure, method and evaluation method of the reliability statistical test of exponentially distributed electronic products. [0003] Various electromechanical products and electronic products represented by servo mechanisms, hydraulic products, and actuator components have great differences in application characteristics and failure modes. In the existing technology, for a long time, there is a lack of systematic research and guidance on the reliability test technology of electromechanica...

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Application Information

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IPC IPC(8): G06F17/50
Inventor张生鹏
OwnerCASIC DEFENSE TECH RES & TEST CENT