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Integrated circuit open/short circuit test method and test machine

A technology for integrated circuit and short-circuit testing, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc.

Active Publication Date: 2016-06-01
华润赛美科微电子(深圳)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide an integrated circuit open / short test method for the technical problems existing in the traditional OS test method

Method used

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  • Integrated circuit open/short circuit test method and test machine
  • Integrated circuit open/short circuit test method and test machine
  • Integrated circuit open/short circuit test method and test machine

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Embodiment Construction

[0024] In order to make the objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0025] image 3 It is a flowchart of an integrated circuit open / short circuit test method in an embodiment. According to the standardization of OS test items, the method first automatically scans and recognizes a type of integrated circuit chip (guaranteed to be a good product IC) that needs to be tested by OS, and then performs the test according to the identified pin distribution table. Specifically include the following steps:

[0026] S110, inserting a good product IC into the test socket.

[0027] S120 , testing the number of ground-to-ground diodes between each pin of the good IC and all other pins to obtain ground-to-ground diode distribution information.

[0028] diode to ground Figure 1A The protection diode shown is connected b...

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PUM

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Abstract

The invention relates to an open / short (OS) test machine for integrated circuits. The OS test machine comprises a control unit, a power module, a test socket, a scan test module, an indication module and a control button; the ICs (integrated circuits) can be inserted in the test socket; the scan test module comprises a current generating circuit, an on-off control circuit and a voltage test circuit, the current generating circuit is used for providing fixed-value currents for pins of the ICs via the test socket, the on-off control circuit is used for grounding of the pins of the ICs, and the voltage test circuit is used for testing voltages of the pins; a scan recognition mode and a test mode of the test machine can be switched over under the control of the control button; the control unit is used for acquiring a pin distribution table of good IC products in the scan recognition modes, performing open / short tests on the to-be-tested ICs in the test modes and outputting failure information to the indication module, so that the failure information can be indicated by the aid of the indication module. The invention further relates to an OS test method for the integrated circuits. The open / short test machine and the open / short test method have the advantage that only the good IC products need to be scanned and recognized at the beginning, so that the to-be-tested ICs can be continuously tested in follow-up procedures.

Description

technical field [0001] The invention relates to a detection device for electrical faults, in particular to an integrated circuit open / short circuit test method, and also to an integrated circuit open / short circuit test machine. Background technique [0002] Open-Short Test (Open-Short Test), also known as ContinuityTest or ContactTest, OS test can quickly detect whether there are electrical physical defects in integrated circuits (IC), such as short circuit of pins, missing bondwire, static electricity of pins damage and manufacturing defects, etc. Most pins of the IC have two diodes connected to the power supply pin V CC Connect to the ground pin GND, such as Figure 1A , Figure 1B As shown, the OS test includes testing the protection diodes of the input and output (I / O) pins of the integrated circuit (including the diodes connected to the ground pin GND and the diodes connected to the power pin V CC The open / short circuit of the power diode) to judge whether the two di...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/02
Inventor 顾汉玉
Owner 华润赛美科微电子(深圳)有限公司
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