Small and micro-sized integrated circuit reliability tester and test method thereof

Abstract

The invention relates to a small and micro-sized integrated circuit reliability tester comprising a control unit, a power supply module, a test socket, a scanning test module, an indication module and a control button. The test socket is used for plugging of an IC. The scanning test module comprises a current generation circuit, a switching control circuit and a voltage test circuit. The current generation circuit is used for providing constant value current to the pins of the IC via the test socket. The switching control circuit is used for controlling the pins of the IC to be grounded. The voltage test circuit is used for testing voltage of the pins. The control button is used for controlling the tester to be switched between a scanning identification mode and a test mode. The control unit is used for obtaining a pin distribution table of the non-defective IC under the scanning identification mode and performing reliability testing on the IC to be tested under the test mode and outputting failure information to the indication module to perform failure information indication. The invention also relates to an integrated circuit test method. The non-defective IC is placed for scanning and identification at the beginning and then continuous testing can be performed on the IC to be tested subsequently.

Description

Technical field [0001] The invention belongs to the technical field of integrated circuit testing, and specifically relates to an integrated circuit reliability testing equipment and a testing method thereof. Background technique [0002] In the design and manufacture of integrated circuits, pins are short-circuited, bond wires are missing, pins are damaged by static electricity, and manufacturing defects. Most of the pins of the IC have two diodes respectively connected to the power pin VCC and the ground pin GND, such as figure 1 , figure 2 As shown, the integrated circuit test includes testing the open / short circuit of the protection diodes of the input and output (I / O) pins of the integrated circuit (including the ground diode connected to the ground pin GND and the power supply diode connected to the power pin VCC) to Determine whether these two diodes are burned or broken down. figure 1 The medium-precision measuring unit 100 pulls a 100μA current, and the measured pin vol...

AI Technical Summary

Problems solved by technology

However, the process from development to testing using a tester is cumbersome, and different ICs to be tested have to correspond to different load boards and test procedures, resulting in difficulty in turnaround and waste of tester resources

When measuring with a multimeter, there are many human factors infiltrated, which increases the instability of the measurement

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