Double-light-source color photometer with SCI/SCE test conditions compatible and implementation method

A technology of test conditions and realization methods, applied in the directions of spectrometry/spectrophotometry/monochromator, optical radiation measurement, radiation pyrometry, etc.

Inactive Publication Date: 2014-02-05
HANGZHOU CHNSPEC TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0010] In view of the above-mentioned deficiencies in the prior art, the purpose of the present invention is to provide a color measuring instrument and its implementation method with dual light sources compatible with SCI / SCE test conditions, aiming to solve the problem of different structures of instruments in the prior art under the SCE measurement conditions. Samples with different surface gloss will have a large inter-device difference

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  • Double-light-source color photometer with SCI/SCE test conditions compatible and implementation method
  • Double-light-source color photometer with SCI/SCE test conditions compatible and implementation method
  • Double-light-source color photometer with SCI/SCE test conditions compatible and implementation method

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Embodiment Construction

[0067] The present invention provides a color measuring instrument with dual light sources compatible with SCI / SCE test conditions and its implementation method. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0068] see Figure 7 , Figure 7 It is a schematic diagram of a preferred embodiment of a color measuring instrument with dual light sources compatible with SCI / SCE test conditions of the present invention. As shown in the figure, a color measuring instrument with dual light sources compatible with SCI / SCE test conditions of the present invention is used for color measurement of samples; wherein, the color measuring instrument includes: spectrometer, light trap (not shown in the figure) out, Fi...

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Abstract

The invention discloses a double-light-source color photometer with SCI/SCE test conditions compatible and an implementation method. Switch of the SCI/SCE test conditions is achieved in the mode of double-light-source active illumination, the design of the optical trap is replaced, and corresponding calibration algorithms are designed for the two test conditions. As is shown in the experimental result, the test results of the double-light-source color photometer on the SCI/SCE test conditions are obviously better than that of the prior art, and the double-light-source color photometer with the SCI/SCE test conditions compatible is more suitable for color test instruments with SCI/SCE test conditions compatible and has prominent value.

Description

technical field [0001] The invention relates to the technical field of color measuring instruments, in particular to a color measuring instrument based on dual light sources compatible with SCI / SCE test conditions and an implementation method thereof. Background technique [0002] In 1971, CIE (International Commission on Illumination) recommended four standard lighting and observation geometric conditions for reflection sample measurement: vertical / 45 (0 / 45), 45 / vertical (45 / 0), vertical / Diffuse (0 / d), Diffuse / vertical (d / 0). For the sake of discussion, the various lighting and viewing conditions can be reduced to the three most common geometric conditions: diffuse lighting, 8-degree viewing angle, including specular reflection components (d / 8:i); diffuse lighting, 8 degree viewing angle, eliminating specular components (d / 8:e); and 45° ring illumination, vertical viewing (45 / 0:c). Since the measurement result is independent of the surface gloss of the material when meas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/46G01J3/10
Inventor 袁琨陈刚王坚
Owner HANGZHOU CHNSPEC TECH
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