Handheld digital integrated circuit parameter tester

Abstract

The invention provides a handheld digital integrated circuit parameter tester and relates to an integrated circuit parameter tester. The handheld digital integrated circuit parameter tester comprises a power management module, a central control module, a chip test interface, a communication module and a man-machine interface module. The output end of the power management module is connected with the power input end of the central control module. The central control module comprises a single-chip microcomputer I and a single-chip microcomputer II, wherein the single-chip microcomputer I is connected with the chip test interface, the single-chip microcomputer II is directly connected with the communication module and the man-machine interface module through I / O pins, and the single-chip microcomputer I and the single-chip microcomputer II are connected with each other directly through an SPI bus. The communication module comprises a serial communication interface chip and a peripheral circuit of the serial communication interface chip. The output end of the communication module is connected with the input end of an upper computer. The handheld digital integrated circuit parameter tester has the advantages that functions are complete, running is stable, operation is simple, the size is small, and the cost is low; the handheld digital integrated circuit parameter tester can serve as an educational instrument or a detection instrument, thereby being suitable for being popularized to school laboratories or electronic amateurs.

Description

technical field [0001] The invention relates to an integrated circuit parameter tester, in particular to a handheld digital integrated circuit parameter tester. Background technique [0002] In the development and design of electronic systems or related practical teaching, many digital integrated circuit chips will be used. Chips will be reused in many occasions, and it is inevitable that chips will fail at this time. Using a damaged digital integrated circuit chip will greatly increase the difficulty of debugging the circuit system, and before using the chip, it is impossible to check whether the function of the chip is intact through common instruments. The professional-grade integrated circuit testing instruments used in engineering have perfect functions, but at the same time, they have disadvantages such as high price, complicated operation, and bulky size. [0003] The invention patent with the announcement number CN202583410 provides a portable Chinese interface dig...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a hand-held digital integrated circuit parameter tester to solve the problem of single test parameters, imperfect functions, complex man-machine interface operation and easy failure, and high test cost when testing digital integrated circuit chips. Shortcomings

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