Method for calculating concentration of interfered element through measurement intensity and concentration of element

Abstract

The invention discloses a method for calculating a concentration of an interfered element through measurement intensity and concentration of an element. The method comprises the following two correction models: (1) spectra overlap correction model and (2) spectra overlap-self-absorption correction model. The method has the beneficial effects of high analytical precision and good stability.

Description

technical field [0001] The invention relates to the application field of spectral analysis technology, in particular to a method for calculating the concentration of disturbed elements through the measured intensity and concentration of elements. Background technique [0002] Under the action of external energy (electric energy), the electrons of the elements in the sample undergo transitions after absorbing energy. From a low energy level to a high energy level, electrons in a high energy state are in an unstable state, and energy is released during the process from a high energy state to a low energy state. , this energy will manifest itself in the form of light, forming the spectrum of the element. [0003] Namely: δE=E 2 -E 1 =hv=hc / λ [0004] The energy level of the spectrum corresponds to the level of the element concentration in the analyzed sample, and the composite light is decomposed into the spectrum of a single element through the optical component grating. S...

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Problems solved by technology

[0008] 2. Non-spectral interference

[0029] However, there are shortcomings in the above-mentioned traditional model. Since the intensity variable in the model itself is not a net signal, it has systematic errors. Therefore, in actual analysis, such calculations in the model may cause further errors, and sometimes even cause out of control

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