A Measuring Method of Particle Temperature δv

A measurement method and technology of particle temperature, which can be used in thermometers, analytical materials, instruments, etc. that give average/integrated values, and can solve problems such as inability to meet particle temperature measurement.

Inactive Publication Date: 2015-11-25
UNIV OF SHANGHAI FOR SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the research of some particle flow pharmaceutical chemical industry and mining industry, high-speed fluidized bed with high-speed particle movement is often needed. These traditional methods cannot meet the measurement of particle temperature at this time.

Method used

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  • A Measuring Method of Particle Temperature δv
  • A Measuring Method of Particle Temperature δv
  • A Measuring Method of Particle Temperature δv

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Experimental program
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Embodiment Construction

[0056] A method for measuring particle temperature δv provided by the present invention will be specifically described below in conjunction with the accompanying drawings.

[0057] figure 1 It is a functional block diagram of the measurement system of the particle temperature δv involved in the embodiment.

[0058] Such as figure 1 As shown, the laser light emitted by a semiconductor laser 10 with a wavelength of 532 nm diffuses through a concave lens 11 with a focal length of 50 mm, and then irradiates on the particles in the fluidized bed 12 to generate speckles in the far field. The random movement in the bed causes the speckle to fluctuate randomly. After the backscattered light passes through the filter 13, the linear array CCD camera 14 with 1024 pixels N takes the exposure time T 0 = 20 microseconds for continuous imaging of this dynamic speckle, the total imaging number K is 1 million (corresponding to the measurement time of 20 seconds), and the linear arra...

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Abstract

The invention provides a particle temperature delta v measuring method used for measuring temperature of particles in a fluidized bed. The measuring method is characterized in that laser acts as a light source which is diffused via a concave lens and then irradiated on the particles in the fluidized bed. Dynamically fluctuated speckles are generated in a far field, and the speckles are continuously imaged by an imaging device with a unit exposure time T0 so that a series of speckle images with T0 as exposure time are obtained. The speckle images are inputted to a computer, and the speckle images with unit exposure time T0 are converted into pixel grey values with unit exposure time T0 by the computer. The pixel grey values with unit exposure time T0 are calculated so that a curve indicating that temperature delta v of the particles changes with time is obtained. According to the particle temperature delta v measuring method, a space-time resolution can reach a microsecond level and a nanometer level.

Description

technical field [0001] The invention relates to a method for measuring particle temperature δv, in particular to a method for measuring particle temperature in a fluidized bed by using a laser as a light source and adopting a line array camera for imaging. Background technique [0002] The fluidized bed suspends a large number of solid particles in the moving fluid, so that the particles have some apparent characteristics of the fluid. The more intense the movement of the particles in the fluidized bed, the better the fluidization effect. According to the particle movement speed in the fluidized bed, the fluidized bed can be divided into: high-speed fluidized bed, low-speed fluidized bed, and high-low-speed mixed fluidized bed. [0003] The particle temperature (granular temperature, <δv>) is used to characterize the activity of the random motion of the particles in the fluidized bed. By referring to the analysis method of the non-uniform dense gas molecular kinetic th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K3/04G01N15/00
Inventor 杨晖杨海马孔平郑刚
Owner UNIV OF SHANGHAI FOR SCI & TECH
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