Non-contact-outage card reader
A non-contact, card reader technology, applied in the field of smart cards, can solve problems such as affecting the test effect, slow hand movement of the card, etc., and achieve good test results.
Active Publication Date: 2014-02-26
EASTCOMPEACE TECH
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Problems solved by technology
The inventor found in the process of realizing the invention: in the existing manual testing method, the communication speed between the smart card and the card reader is very fast, but the speed of moving the card by hand is too slow, which affects the test effect
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[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] One of the main ideas of the embodiments of the present invention includes:
[0026] For the non-contact card reader, it generates electricity through the coupling of the generated magnetic field, and then communicates with the non-contact card reader. If the magnetic field generated by the non-contact card reader disappears, it is equivalent to cutting off the non-contact card reader. Without the power supply of the contactless smart card, data communi...
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The invention provides a non-contact-outage card reader. The non-contact-outage card reader comprises an MCU, an outage control chip and a non-contact type radio frequency chip, wherein the outage control chip is connected with the MCU and the non-contact type radio frequency chip is connected with the MCU and the outage control chip. A radio frequency module generating a magnetic field is arranged in the non-contact type radio frequency chip. The non-contact type radio frequency chip is used for conducting data communication with a non-contact type intelligent card. The MCU is used for sending an outage control signal to the outage control chip. The outage control chip is used for controlling the radio frequency module in the non-contact type radio frequency chip to power down when the outage control signal sent by the MCU is received, so that the magnetic field generated by the radio frequency module disappears, and data communication between the non-contact type radio frequency chip and the non-contact type intelligent card is interrupted. According to the non-contact-outage card reader, a tester can interrupt data communication between the card reader and the non-contact type intelligent card without moving the non-contact type intelligent card, and the testing effect is good.
Description
technical field [0001] The invention relates to the technical field of smart cards, in particular to a non-contact power-off card reader. Background technique [0002] With the advent of the Internet of Things era, the application scenarios of smart cards are becoming more and more complex, not only in the field of mobile phone applications, but also in mobile payment, financial IC cards and other fields. [0003] For companies engaged in smart cards, it is usually necessary to test the smart card to test the performance and damage of the smart card under abnormal operation conditions. For example, an abnormal operation is to suddenly cut off the communication between the smart card and the card reader during the communication process, and then test whether the smart card is damaged after repeated times. [0004] In the prior art, cutting off the communication between the smart card and the card reader usually adopts a manual test method of suddenly taking the card away whe...
Claims
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Inventor 宋魏杰张汉就于明许鸿锦
Owner EASTCOMPEACE TECH