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Semiconductor device and detection method thereof

A detection method, semiconductor technology, applied in the direction of single semiconductor device testing, static memory, instrument, etc., can solve the problem of no detection mechanism

Active Publication Date: 2014-03-26
WINBOND ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, in the case of no external resistor connected, there is no such detection mechanism at present whether the resistor terminal is coupled to the working voltage or ground voltage, or is floating.

Method used

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  • Semiconductor device and detection method thereof
  • Semiconductor device and detection method thereof
  • Semiconductor device and detection method thereof

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Embodiment Construction

[0034] Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings. In addition, elements / members using the same reference numerals in the drawings and embodiments represent the same or similar parts.

[0035] It will be understood that when an element is referred to as being "on," "connected to," or "coupled to" another element, it can be directly on, connected to, or coupled to the other element, Or there may be intervening elements. In contrast, when an element is referred to as being "directly on," "directly connected to," or "directly coupled to" another element, there are no intervening elements present.

[0036] figure 1 is a schematic diagram of a semiconductor device according to an embodiment of the present invention. see figure 1 . The semiconductor device 100 includes a resistor terminal 10 , a dummy pull up driver 20 , a comparator 30 and a detection state machine 40 . The analo...

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Abstract

The invention discloses a semiconductor device and a detection method thereof. The semiconductor device comprises a resistive end, a simulation pull-up driver, a comparer, and a detection stater. The resistive end is used for connecting an external resistor; and the simulation pull-up driver provides 20 to (2N+1-1)-level drive action, N is a natural number. The comparer outputs a comparison signal in response to a test voltage and a reference voltage. The test voltage is generated at the coupled joint between the resistive end and the simulation pull-up driver. The detection stater is used for controlling the drive action of the simulation pull-up driver, and producing and outputting a detection signal according to the comparison signal. The detection signal is used for representing that the electrical connection state of the resistive end is a work state connection or floating state, an external resistor connection state, or a grounding voltage connection state. The detection method provided by the invention can determine whether an external resistor exists at the resistive end of the semiconductor device.

Description

technical field [0001] The invention relates to a semiconductor device and a detection method thereof, and in particular to a semiconductor device capable of detecting the electrical connection state of its own resistance terminal and a detection method thereof. Background technique [0002] A semiconductor device with a resistor terminal (such as a dynamic memory device) needs to detect whether there is an external resistor coupled to the resistor terminal. The detection mechanism of a general semiconductor device can determine whether there is an external resistor, but it does not take into account the situation that the external resistor is not connected. Therefore, in the case of no external resistor connected, there is no such detection mechanism at present whether the resistor terminal is coupled to the working voltage or ground voltage, or is floating. Contents of the invention [0003] In view of this, the present invention proposes a semiconductor device and a de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G11C29/00
Inventor 张智翔
Owner WINBOND ELECTRONICS CORP