Semiconductor laser array optical characteristic detection device

Abstract

The invention provides a semiconductor laser array optical characteristic detection device, and relates to the technical field of lasers. The semiconductor laser array optical characteristic detection device comprises a semiconductor laser array, a detection device body, an electronic control horizontally-moving platform and a computer. The detection device body comprises an absorption module A, an absorption module B, a reflecting prism A, a reflecting prism B and a plane mirror. The absorption module A and the absorption module B are arranged at the upper portion of the detection device body and the lower portion of the detection device body respectively. The bottom of the reflecting prism A is fixed below the absorption module A, and the tip end of the reflecting prism A inclines downward. The bottom of the reflecting prism B is fixed above the absorption module B, and the tip end of the reflecting prism B inclines upward. The tip end of the reflecting prism A and the tip end of the reflecting prism B are close to each other to form a gap. The plane mirror is fixed to the middle axis of the gap and located behind the reflecting prism A and the reflecting prism B. By means of the semiconductor laser array optical characteristic detection device, high-precision and automated detection is conducted on optical characteristic parameters of bar chips in the semiconductor laser array, quality of the semiconductor laser array optical characteristic detection device is effectively controlled, and cost is reduced.

Description

technical field [0001] The invention relates to the field of laser technology, in particular to a semiconductor laser array optical characteristic detection device. Background technique [0002] Semiconductor lasers have the advantages of small size, light weight, long life, high electro-optical conversion efficiency and high reliability. They are widely used in industrial, medical and material processing fields, and have become the most promising field in the optoelectronic industry. Due to the continuous increase in the power requirements of lasers in practical applications, from the perspective of packaging, in order to obtain high power output, most of the current methods are to increase the power of semiconductor lasers by several orders of magnitude by stacking multiple bars in the laser array in the vertical direction, but at the same time It will reduce the beam quality and have high requirements on the micro-optical system device and laser array stack technology. T...

AI Technical Summary

Problems solved by technology

At present, the measurement of the Smile value focuses on the test of a single bar before packaging. The measurement of the fast axis divergence angle is mainly for the laser array, and it is impossible to accurately measure the optical transmission characteristics of the laser array and each bar at the same time.

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