Power supply test system and method

A power supply testing and power supply technology, applied in the field of testing, can solve problems such as quality problems, failures, and low utilization of equipment resources, and achieve the effects of improving utilization, saving equipment costs, and improving quality and reliability

Inactive Publication Date: 2014-06-18
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, these test conditions have not reached the working limit conditions of the communication power supply. When the later communication power supply is close to the working limit conditions in practical applications, failures may st

Method used

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  • Power supply test system and method
  • Power supply test system and method

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Embodiment Construction

[0037] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0038] In the present invention, for the convenience of description, the power supply under test described below refers to the communication power supply under test.

[0039] figure 1 It is a structural schematic diagram of the power testing system of the present invention, as figure 1 As shown, the power supply testing system includes a high and low temperature test chamber 1, a program-controlled power supply 2, a program-controlled load 3, a data collector 4, a channel control card 5 and a test control device 8, and the high and low temperature test chamber 1, the program-controlled The power supply 2, the program-controlled load 3, the data collector 4, and the channel control card 5 are all connected to the test control device 8 through a communication interface; wherein,

[0040] The high and low temperature test chamber 1 is ...

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PUM

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Abstract

The invention discloses a power supply test system, which comprises a high-low temperature test box, a program-controlled power supply, a program-controlled load, a channel control card and a data acquisition device, wherein the high-low temperature test box, the program-controlled power supply, the program-controlled load, the channel control card and the data acquisition device are connected with test control equipment via communication interfaces. The invention also discloses a power supply test method. According to the system and the method, mass screening test can be carried out on communication power supplies in a simulated limit working environment, the quality and reliability of communication power supplies leaving the factory can be improved, and a single program-controlled power supply and a single program-controlled load can be used for carrying out screening test on a plurality of communication power supplies.

Description

technical field [0001] The invention relates to the testing field, in particular to a power supply testing system and method. Background technique [0002] The communication power supply is the heart of the communication system. A stable and reliable communication power supply is the key to ensure the safe and reliable operation of the communication system. The communication circuit is interrupted and the communication system is paralyzed, resulting in great economic and social benefit losses. [0003] At present, in order to ensure the quality of the communication power supply, before the communication power supply leaves the factory, it is necessary to perform a function test and an aging test on it. The functional test of the communication power supply is generally only carried out at room temperature; the aging test is only simulated in a high-temperature environment for testing. Screen the communication power supply through functional test and aging test, screen out t...

Claims

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Application Information

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IPC IPC(8): G01R31/40
Inventor 秦方庆张啸宇李恩山
Owner ZTE CORP
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