Method and device for measuring double-prism refractive index on basis of optical levers

An optical lever and double prism technology, applied in the field of optical measurement, can solve the problems of cumbersome instrument adjustment, high cost, complicated instrument and so on

Inactive Publication Date: 2014-06-25
INNER MONGOLIA UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Refractive index is an important parameter of a double prism. At present, the methods used to measure this parameter include light wave interference method, secondary imaging method, and spectrometer measurement. These methods use complicated instruments, cumbersome instrument adjustments, and relatively low cost. high

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  • Method and device for measuring double-prism refractive index on basis of optical levers
  • Method and device for measuring double-prism refractive index on basis of optical levers
  • Method and device for measuring double-prism refractive index on basis of optical levers

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Embodiment Construction

[0040] The above and other technical features and advantages of the present invention will be described in more detail below in conjunction with the accompanying drawings.

[0041] The invention utilizes an optical lever to realize the measurement of the refraction index of the double prism through the method of geometric optics.

[0042] see figure 1 As shown, it is a structural schematic diagram of the device for measuring the refractive index of a double prism based on an optical lever in the present invention. Scale 11, double prism 12, described base 1 is made of cast iron, long 50cm, high 30cm; Slide rail 2 is installed on the base 1, and slide rail is made of steel, and 30cm is long, and middle part is grooved; Described slide rail 2 A lead screw 3 is installed, and the lead screw 3 is placed in the groove of the slide rail 2; the lead screw 3 passes through the lower end of the loading platform 4 and is connected thereto. Horizontal movement, in this embodiment, the ...

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Abstract

The invention relates to a method and device for measuring the double-prism refractive index on basis of optical levers. The device comprises a base, a sliding rail, a laser self-aligner, a support and a ruler, wherein the base is provided with the sliding rail, the sliding rail is provided with a screw rod, the screw rod penetrates through the lower end of an objective table and is connected with the objective table, when the screw rod is rotated, the objective table can move horizontally on the sliding rail, one end of the guide rail is provided with a lifting block, the other end of the guide rail is provided with the laser self-aligner, the support is installed on the end portion of the base, the support is provided with an optical lever set, the sliding rail is provided with a leveling screw and a positioning screw, the horizontal angle of the sliding rail is adjusted through the leveling screw, the lifting block can ascend and descend through rotation of the positioning screw at the lower end of the lifting block, the ruler is composed of a plane mirror, and the surface of the plane mirror is provided with millimeter graduations. According to the method and device, experiment phenomena are visual, precision is high, cost is low, operations can be easily and conveniently carried out, new college physical experiment items can be developed through the method and device, and the method and device are suitable for being used in colleges.

Description

technical field [0001] The invention relates to the field of optical measurement, in particular to a method and device for measuring the refractive index of a double prism based on an optical lever. Background technique [0002] The double prism is an important optical device that can be used to observe and measure a series of optical quantities, such as the wavelength of light waves. Refractive index is an important parameter of a double prism. At present, the methods used to measure this parameter include light wave interference method, secondary imaging method, and spectrometer measurement. These methods use complicated instruments, cumbersome instrument adjustments, and relatively low cost. high. [0003] In view of the above-mentioned defects, the author of the present invention has finally obtained this creation through long-term research and practice. Contents of the invention [0004] The object of the present invention is to provide a method and device for measu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 李国峰董大明李剑生
Owner INNER MONGOLIA UNIV OF SCI & TECH
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