Experimental facility used for high-low temperature optical evaluation

An experimental device, high and low temperature technology, applied in optics, nonlinear optics, testing optical performance, etc., can solve problems such as difficult temperature control box condensation, inability to perform environmental optical evaluation, and affect optical testing, etc., to achieve uniform temperature Effect

Active Publication Date: 2014-07-23
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] Disadvantages: The optical lens cannot adapt to the high and low temperature inside the cabinet, and the corresponding environmental optical evaluation cannot be carried out
If a lens is added outside the bo

Method used

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  • Experimental facility used for high-low temperature optical evaluation

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Example Embodiment

[0025] The specific embodiments of the present invention will be described in further detail below in conjunction with the drawings and embodiments. The following examples are used to illustrate the present invention, but not to limit the scope of the present invention.

[0026] In order to solve the problem that the high and low temperature environment in the optical evaluation system in the prior art affects the performance of the optical lens and the condensation generated in the test environment affects the test accuracy, the present invention provides a closed experimental device, which mainly includes: a closed box, a sample carrier Table, temperature sensor, heat-carrying gas circulation channel and optical test probe; the sample carrier is set in the closed box, on which the sample to be tested is placed; the temperature sensor is set in the closed box to measure the temperature value in the closed box in real time, The temperature environment in the closed box can meet t...

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Abstract

The invention discloses an experimental facility used for high-low temperature optical evaluation. The experimental facility comprises a sealed box, a sample platform deck, a temperature sensor, a heat-carrying gas inlet channel, a heat-carrying gas overflow channel and an optical test probe, wherein the sample platform deck is arranged inside the sealed box and used for placement of test samples, the temperature sensor is arranged above the sample platform deck and used for measuring temperature in the sealed box, the heat-carrying gas inlet channel is arranged on one side wall of the sealed box and used for leading in heat-carrying gas, the heat-carrying gas overflow channel is arranged on the other side wall of the sealed box and used for exhausting the redundant heat-carrying gas, and the optical test probe is arranged outside the sealed box, located above the sample platform deck, and used for measuring optical performance parameters of the test samples. The specific heat capacity of the heat-carrying gas is greater than 500J/(kg* DEG C). According to the experimental facility, heating evenness of the test samples is good, an optical test lens will not be affected by high and low temperature, no congealing fog is generated in the box, and optical test accuracy is high.

Description

technical field [0001] The invention relates to optical information measurement technology, in particular to an experimental device for high and low temperature optical evaluation. Background technique [0002] The liquid crystal molecules are arranged in an orderly manner in the cell, and the operation is controlled by the driving voltage between the cells, which is the basic characteristic of realizing the display of the liquid crystal panel. The applicable temperature of different liquid crystal molecules is different, and the molecular characteristics will develop to two extremes of liquid or crystal with the temperature change. For problems such as black screen (white screen) and slow response time, especially for military and outdoor products, LCD panels need to have higher temperature reliability. [0003] Based on the above background, the characteristic evaluation of LCD panels in high and low temperature environments is an important evaluation method to avoid defe...

Claims

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Application Information

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IPC IPC(8): G02F1/13G01M11/02
Inventor 赵秀强
Owner BOE TECH GRP CO LTD
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