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Chip packages with terminal pads of different form factors

A chip packaging and terminal technology, which is applied in the fields of electric solid state devices, semiconductor devices, semiconductor/solid state device components, etc., and can solve the problem of time-consuming testing.

Active Publication Date: 2017-03-01
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Testing can be time consuming and may require keeping a large number of test slots available in production

Method used

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  • Chip packages with terminal pads of different form factors
  • Chip packages with terminal pads of different form factors
  • Chip packages with terminal pads of different form factors

Examples

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Embodiment Construction

[0062] Aspects and embodiments are described below with reference to the drawings, wherein like reference numerals are generally used to refer to like elements throughout. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more aspects of the embodiments. It will be apparent, however, to one skilled in the art that one or more aspects of these embodiments may be practiced with a lesser degree of specific detail. In other instances, well-known structures and elements are shown in schematic form in order to facilitate describing one or more aspects of the embodiments. Accordingly, the following description does not have a limiting sense, and the scope is defined by the appended claims. It should also be noted that the representations of various layers, sheets, chips or substrates in the figures are not necessarily to scale.

[0063] In the following description, reference is ...

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PUM

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Abstract

A chip package includes an integrated circuit chip. A first set of terminal pads of the chip package is electrically connected to the integrated circuit chip, and a second set of terminal pads of the chip package is electrically connected to the integrated circuit chip. The first and second sets of terminal pads are arranged on a common terminal surface of the chip package. The pad size of the terminal pads in the first group of terminal pads is larger than the pad size of the terminal pads in the second group of terminal pads.

Description

technical field [0001] The present invention relates to electronic devices, and more particularly to techniques for packaging integrated circuit semiconductor chips. Background technique [0002] Manufacturers of semiconductor devices are constantly striving to improve the performance of their products while reducing their manufacturing costs. A cost-intensive area of ​​semiconductor device manufacturing is the testing of semiconductor chips. As will be appreciated by those skilled in the art, package level testing involves depositing individual chip packages into test slots to screen failed packages from good ones. Testing can be time-consuming, and it may be necessary to keep a large number of test slots available in production. Contents of the invention [0003] According to one aspect of the present disclosure, a chip package is provided, including: [0004] integrated circuit chip, [0005] a first group of terminal pads of the chip package electrically connected ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/488H01L23/544
CPCH01L22/32H01L2224/48091H01L2224/73204H01L2224/73265H01L2924/00014H01L23/49838
Inventor P·奥斯米茨
Owner INFINEON TECH AG