a test circuit
A technology for testing circuits and circuits, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems of accidental breakage of test lines, jumping of test voltage signals, etc., and achieves the effect of simple and practical structure and reliable operation.
Active Publication Date: 2016-09-14
SHENYANG AIRCRAFT DESIGN INST AVIATION IND CORP OF CHINA
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- Abstract
- Description
- Claims
- Application Information
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Problems solved by technology
In these test methods, the pressure, image, etc. are often disturbed, and occasionally the test line is accidentally broken, so the test voltage value will return to zero, which leads to the application of the test voltage signal jump.
Method used
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Embodiment Construction
[0015] A test circuit characterized in that an upper resistor R1 and a lower resistor R2 are drawn from the positive electrode of a DC power supply to form a series circuit; a circuit L is drawn between the upper resistor R1 and the lower resistor R2, and a working indicator is connected in series with the L circuit Connect the L circuit to the negative electrode of the power supply with the working test line CD. The L circuit forms a parallel circuit with the lower resistor R2. On both sides of the lower resistor R2 are the test points AB where the computer collects voltage signals.
[0016] The DC power supply voltage is DC 5V or less.
[0017] The upper resistor R1 and the lower resistor R2 are resistors with the same resistance value and the same power.
[0018] The working test wire CD is an enameled wire or a special insulated wire.
[0019] The working indicator light is an LED light with a voltage drop of 0.6 volts.
[0020] The application of the present invention in the life-...
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The invention discloses a test circuit and relates to the fields of computer test technologies, electric appliance application and the like, in particular to a novel test circuit. The test circuit is characterized in that an upper resistor R1 and a lower resistor R2 are led out from a direct-current power source positive electrode to form a series circuit, a circuit L is led out from the position between the upper resistor R1 and the lower resistor R2, the circuit L is internally connected with a work indicating light, a work test line C and a work test line D in series, the circuit L is connected with a power source negative electrode, the circuit L and the lower resistor R2 form a parallel circuit, and the two sides of the lower resistor R2 are provided with a test point A and a test point B for collecting voltage signals by a computer. The novel test circuit is simple and practical in structure, capable of resisting interferences, reliable in work and suitable for being used in complex environments and under the condition that a conventional sensor can not conveniently conduct measurement.
Description
Technical field [0001] The invention relates to the fields of computer testing technology, electrical appliance applications and the like, and in particular to a new type of testing circuit. Background technique [0002] The life-saving system test is a complex process of high pressure, high speed, and linkage of various components. The working sequence of the life-saving system is very important for the pilots to eject safely during the escape process. In the life-saving system test, it is necessary to collect the start and stop time of the system and related components, and it is necessary to perform data analysis on the same coordinate axis. In routine life-saving tests, various sensors are usually used to collect data and judge the working status of components based on data changes. In these test methods, pressure, images, etc. are often disturbed, and occasionally the test circuit is accidentally broken, so the test voltage value will return to zero, which leads to the appl...
Claims
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IPC IPC(8): G01R31/00
Inventor 王冠男李生玉张玉光蒋安平
Owner SHENYANG AIRCRAFT DESIGN INST AVIATION IND CORP OF CHINA