Method for carrying out insertion loss test through simple probe

A simple, impedance test strip technology, applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of expensive probe station, difficult operation, easy damage, etc., and achieve easy promotion, accurate results, good stability effect

Inactive Publication Date: 2014-08-20
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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Problems solved by technology

There are two types of probe station and GGB probe. The probe station is very expensive, a

Method used

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  • Method for carrying out insertion loss test through simple probe

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[0026] Examples:

[0027] As attached figure 1 As shown, design two traces on the circuit board. Trace A is longer than trace B. Trace B should not be too short. The difference between the length of trace A and B should be more than 4 inches. Then, in this example, A, B The lengths of the two traces are La and Lb respectively.

[0028] Using a 12-port vector network analyzer VNA combined with a self-made simple probe to measure the insertion loss of the two signal traces A and B and the vias, respectively, ILA and ILB.

[0029] After the measurement, the insertion loss per unit length is calculated according to the formula: (ILA-ILB) / (La-Lb).

[0030] At this time, the calculated insertion loss value is the insertion loss of the PCB trace in the true sense, and is not affected by the probe and the via.

[0031] In the PCB routing design, ensure that the stack, test points and vias of the two signal lines are exactly the same. Avoid affecting the test results due to other reasons.

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Abstract

The invention provides a method for carrying out an insertion loss test through a simple probe. The method comprises the steps that two wires are arranged on a PCB of an impedance test strip coupon provided with a ground point, the two wires have identical lamination, test points and through holes, and one wire is longer than the other; a vector network analyzer is used in cooperation with the probe to measure insertion loss of the through holes of the two wires; the difference between insertion loss of the through holes of the two wires is divided by the different between the lengths of the two wires, the insertion loss per unit length is calculated, and the insertion loss is measured insertion loss. Compared with the prior art, the method for carrying out the insertion loss test through the simple probe has the advantages that the overall manufacturing cost of the test tool is low, signal testing is accurate, the method is good in overall stability, high in reliability, convenient to operate and low in price, and the probe cannot be easily damaged.

Description

Technical field [0001] The invention relates to the technical field of integrated circuit design, in particular to a method with strong practicability and a simple probe for insertion loss testing. Background technique [0002] Insertion loss (ie insertion loss: insertion loss) is a key parameter to measure PCB signal loss. It is due to the loss of load power due to the insertion of a component or device somewhere in the transmission system. It is expressed as the component or device The ratio of the power received on the load before insertion to the power received on the same load after insertion in decibels, its importance in the design can be compared with impedance matching. [0003] High loss can cause signal attenuation, closed eye diagrams, and jitter in the channel; low loss can cause signal overshoot and signal reflection. The empirical data in recent years shows that the use of high-performance materials alone cannot effectively reduce losses. In addition to materials, ...

Claims

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Application Information

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IPC IPC(8): G01R27/26
Inventor 吴修权
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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