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Object detection device

A technology for detecting devices and objects, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of slow operation speed, waste of manpower and time, lifting of objects 2, etc., so as to reduce external interference and errors, eliminate labor requirements, The effect of improving inspection yield

Active Publication Date: 2016-12-28
CASETEK COMP (SUZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the known object detection device 1 needs to use the spacer T every time it detects, and the thickness of the spacer T may also have errors, resulting in a decrease in detection accuracy.
In addition, when the spacer T is inserted, the object 2 may also be lifted, which may lead to misjudgment by the object detection device 1
Moreover, each inspection requires manual operation, and the operation speed is quite slow. When the objects to be inspected are different, their standard inspection depths are also different. These two factors lead to a large number of inspections, which consume manpower and time Huge, increase production cost

Method used

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Embodiment Construction

[0027] An object detection device according to a preferred embodiment of the present invention will be described below with reference to related drawings, wherein the same components will be described with the same component symbols.

[0028] Figure 2A is a schematic diagram of the appearance of an object detection device in a preferred embodiment of the present invention, Figure 2B for Figure 2A An exploded schematic of the object detection device shown. Please also refer to Figure 2A and Figure 2B As shown, the object detection device 3 is used to detect the object 4 having the concave portion 41 , more precisely, to detect whether the depth H3 of the concave portion 41 of the object 4 meets the standard.

[0029] Such as Figure 2A and Figure 2B As shown, in this embodiment, the object detection device 3 sequentially includes a base 31, a measurement module 32 and a platform 34 from bottom to top. In this embodiment, the measurement module 32 includes a connecti...

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Abstract

An object detection device includes a base, a platform, a drive assembly, a measurement module and at least one detection unit. The base has a plurality of support columns. The platform has an upper surface. The platform is arranged on the support column parallel to the base, and the platform has an opening. The upper surface supports the object, and the concave portion of the object protrudes from the upper surface. The drive assembly is arranged on the base. The measurement module is arranged on the drive assembly. The measuring module protrudes from the upper surface of the platform to a set height through the opening, and the measuring module can move relative to the base along the detection direction under the driving of the driving component. The detection unit is arranged on the upper surface. Wherein, during detection, the driving component drives the measurement module to move in the detection direction. If the detection unit detects that the object moves with the measurement module, the depth of the concave portion of the object is less than or equal to the set height. The object detection device of the present invention can automatically detect objects, avoid errors and operational difficulties caused by manual detection, and enable objects to be detected efficiently.

Description

technical field [0001] The present invention relates to an object detection device, in particular to an object detection device capable of improving detection efficiency. Background technique [0002] In recent years, with the development of high-tech industries, the requirements for precision have become higher and higher. The high precision of machine tools, various industrial machinery, and measuring instruments, coupled with ultra-precision processing machines, semiconductor process equipment, and electronic information equipment , Atomic force microscopes and other tools have reached the micro / nano level. Therefore, providing the dimensional accurate parts and components required by the above-mentioned mechanical equipment has become one of the main factors affecting product quality and operational efficiency. [0003] In order to meet the requirements of the size and precision of the parts and components of each machine and equipment, it has developed its own testing ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/22
Inventor 吴曦晖赵力蓉
Owner CASETEK COMP (SUZHOU) CO LTD