Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A rapid and non-destructive method for measuring cotton leaf area index

A technology of leaf area index and measurement method, applied in the agricultural field, can solve the problem that the leaf area index measurement method cannot meet the requirements of fast and non-destructive

Inactive Publication Date: 2017-06-13
INST OF COTTON RES CHINESE ACAD OF AGRI SCI
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In order to solve the technical problem that the existing method for measuring leaf area index cannot meet the requirements of fast and nondestructive, the present invention provides a method for quickly and nondestructively measuring cotton leaf area index, including:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A rapid and non-destructive method for measuring cotton leaf area index
  • A rapid and non-destructive method for measuring cotton leaf area index
  • A rapid and non-destructive method for measuring cotton leaf area index

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0041] This embodiment provides a quick and non-destructive method for measuring cotton leaf area index, and the steps are as follows: figure 1shown, including the following steps:

[0042] Step S1, calculate the leaf area index according to the combination of cotton canopy transmission and leaf scattering.

[0043] Step S2, correcting the leaf area index using the correction model to obtain the corrected leaf area index, the correction model is:

[0044] LAI=0.84*LAI AccuPAR +0.0879

[0045] Where LAI is the modified leaf area index, LAI AccuPAR is the leaf area index calculated before correction.

[0046] The above method corrects the leaf area index calculated fro...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a rapid lossless measuring method for a cotton leaf area index. The rapid lossless measuring method includes calculating the leaf area index according to combination of cotton canopy transmission and blade scattering, and correcting the leaf area index by a correction model to acquire the corrected leaf area index. The correction model is LAI=0.84*LAIAccuPAR+0.0879, the LAI refers to the corrected leaf area index, and the LAIAccuPAR refers to the leaf area index acquired by calculation before correction. A conventional destructive direct measuring method is replaced by the indirect measuring method, the leaf area index acquired by calculation according to the combination of cotton canopy transmission and blade scattering is corrected by the correction model, and the real leaf area index of cotton groups in the field is figured out through back calculation. The method can be used for rapidly and effectively estimating a real value of the leaf area index of the cotton groups in the field without losses, estimating and judging the growth trend of the cotton groups and applying corresponding planting measures for field management.

Description

technical field [0001] The invention relates to the field of agricultural technology, in particular to a method for quickly and nondestructively measuring cotton leaf area index. Background technique [0002] Leaf is an important organ for photosynthesis and synthesis of organic matter in cotton. Leaf Area Index (LAI) is an important indicator for judging the growth and development of field cotton, and directly affects cotton yield and fiber quality to a certain extent. The leaf area index is also an important parameter to characterize the cotton canopy structure and judge the growth of cotton, and it is also a key factor to determine the biomass and final yield of cotton. Leaf area index is a dimensionless parameter. Its size can determine the microclimate form above and below the cotton canopy. It can well describe the physiological processes of photosynthesis, transpiration, water interception, and spectral radiation in the cotton canopy system. It is an important physiol...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/28G01N21/59G01N21/49
Inventor 刘绍东张思平张雷马慧娟刘志红赵新华牛静董合林李鹏程刘敬然
Owner INST OF COTTON RES CHINESE ACAD OF AGRI SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com