Phase information extraction method of electronic speckle interference fringe pattern

A technology of electronic speckle interference and phase information, which is applied in the field of optical detection and optical information processing, and can solve problems such as threshold difficulty, edge blur, and sawtooth.

Active Publication Date: 2018-08-21
TIANJIN POLYTECHNIC UNIV
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  • Description
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Problems solved by technology

However, this method is difficult to select the threshold in the process of determining the skeleton line, and the extracted skeleton line is easy to break
C-spline interpolation in traditional linear interpolation can achieve better results for flat areas of the image, but it cannot identify edges well, resulting in blurred or jagged edges

Method used

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  • Phase information extraction method of electronic speckle interference fringe pattern
  • Phase information extraction method of electronic speckle interference fringe pattern
  • Phase information extraction method of electronic speckle interference fringe pattern

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Embodiment Construction

[0057] The present invention will be further described in detail below in combination with specific embodiments.

[0058] Modern optical measurement technology expresses the physical properties of objects in the form of light interference fringe patterns. The key to obtaining the deformation and displacement information of objects from fringe patterns is to accurately extract the phase, and the most direct method for extracting phases is the fringe skeleton line method. The invention proposes a method for extracting the phase information of the fringe pattern of the electronic speckle interference non-destructive detection.

[0059] As we all know, tires are one of the most common and commonly used industrial products. With the country's emphasis on transportation safety, the issue of tire quality inspection has attracted the attention of many tire manufacturers. The internal defects of tires - delamination and air bubbles are produced during the tire manufacturing process, wh...

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Abstract

The invention discloses a method for extracting phase position information of an electronic speckle interference fringe pattern. The method comprises the steps that firstly, an electronic speckle interference fringe image I is input into an image processing device; secondly, a skeleton line of the fringe image is extracted; thirdly, series calibration is carried out on the skeleton line through human-machine interaction, and a result image serves as an input image u before phase position interpolation; fourthly, the time step delta t and the iterations n are set; fifthly, the numerical solutions of all pixels of the image u are solved based on the difference scheme and the energy correction condition of a heat conduction diffusion equation; sixthly, the numerical solution obtained when the set maximum iterations n is achieved is the phase position image obtained after interpolation. The method can be widely applied to obtaining the phase position information of the electronic speckle interference fringe pattern.

Description

technical field [0001] The invention belongs to the technical field of optical detection and optical information processing, and relates to a method for extracting phase information of an electronic speckle interference fringe pattern. Background technique [0002] Electronic speckle interferometry (ESPI) is an important non-destructive testing technology. It uses optical interference to record the speckle interference fringe pattern that carries the state change information of the object. Minor displacements, deformations and imperfections. Because this technology has the advantages of simple structure, strong anti-interference ability, non-contact, high precision and high sensitivity (micron level or even tens of nanometers), no light protection, no special shockproof, fast real-time and online detection, etc., in composite materials It has important applications in surface or internal defect detection of integrated circuits, pressure vessels and welding objects, and is a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00
Inventor 张芳肖志涛耿磊吴骏李月龙王丹珏
Owner TIANJIN POLYTECHNIC UNIV
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