Device and method for single-shot signal-to-noise ratio measurement based on optical Kerr shutter

A technology of optical Kerr shutter and measuring device, which is applied in the field of optical measurement, can solve the problem that the scanning method is no longer applicable, and achieve the effect of simple structure, large spectral receiving range and high time resolution

Active Publication Date: 2017-05-03
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

For the SNR measurement of ultra-short and ultra-intense laser pulses with low repetition rate or even no repetition rate (single), the scanning method is no longer applicable, and a single-shot SNR measurement technology with high dynamic range must be developed, that is, only According to a laser pulse, the signal-to-noise ratio information of the pulse front in a certain time window can be measured, but the existing single-shot signal-to-noise ratio measurement technology still can only reach about 10 6 dynamic range of

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  • Device and method for single-shot signal-to-noise ratio measurement based on optical Kerr shutter
  • Device and method for single-shot signal-to-noise ratio measurement based on optical Kerr shutter
  • Device and method for single-shot signal-to-noise ratio measurement based on optical Kerr shutter

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Embodiment Construction

[0026] see Figure 1-2 , a single-shot signal-to-noise ratio measurement device based on an optical Kerr shutter, including a beam splitting unit for splitting the signal light to be measured, a signal light channel for the signal light to be measured to pass through, and an optical Kerr medium An optical Kerr shutter composed of two polarizers perpendicular to the polarization direction and a detection device for receiving measurement data for detection; the beam splitting unit includes a first polarizer 1 for changing the signal light to be measured into linearly polarized light, The first beam splitter 2 used to divide the signal light to be measured into two beams, one of which is used as the shutter light of the first-stage optical Kerr shutter; the other beam is split by the second beam splitter 6 and split again One of the beams of signal light passes through the signal channel to be tested as the signal light to be tested, and the other beam is used as the shutter ligh...

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Abstract

The invention relates to a one-time signal-to-noise ratio measuring device and method based on a optical Kerr shutter. The measuring device comprises a beam splitting unit used for carrying out beam splitting on signal light to be measured, a to-be-measured signal light channel used for the signal light to be measured to pass through, the optical Kerr shutter and a detecting device, wherein the optical Kerr shutter is formed by two polarization devices with optical Kerr media perpendicular to the polarization direction, and the detecting device is used for receiving and detecting measured data. According to the one-time signal-to-noise ratio measuring device and method based on the optical Kerr shutter, time resolution is high, a time window is large, the spectrum receiving range is large, the structure is simple, the measuring device is convenient to use and practical, and the cost is low.

Description

technical field [0001] The invention belongs to the field of optical measurement, and relates to a signal-to-noise ratio measurement device and method, in particular to a single-shot signal-to-noise ratio measurement device and method based on an optical Kerr shutter. Background technique [0002] In recent years, with the continuous development of chirped pulse amplification (CPA) and optical parametric chirped pulse amplification (OPCPA), research on ultrashort and ultraintense pulse laser technology has achieved leapfrog development. Nuclear fusion high-power solid-state lasers are coupled to form a new generation of ultra-short and ultra-intense pulse solid-state lasers. The obtained pulse width is generally tens of femtoseconds to hundreds of femtoseconds, the output power exceeds 1PW, and the focusing power density is as high as 10 19 ~10 22 W / cm 2 . Such power density creates unprecedented extreme physical conditions such as strong electric field, strong magnetic f...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00
Inventor 刘红军孙启兵黄楠
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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