Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Elliptical speckle generation method for large-viewing-field large-dip-angle measurement

A technology with a large inclination angle and a large field of view, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problem of not being able to reflect the grayscale changes of the wing surface, and achieve the effect of easy control of shape and size and improved accuracy.

Active Publication Date: 2015-02-18
XI AN JIAOTONG UNIV
View PDF4 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Cannot reflect the grayscale changes on the wing surface when the field of view is large

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Elliptical speckle generation method for large-viewing-field large-dip-angle measurement
  • Elliptical speckle generation method for large-viewing-field large-dip-angle measurement
  • Elliptical speckle generation method for large-viewing-field large-dip-angle measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0022] In this embodiment, as a typical application scenario with a large field of view and a large inclination angle, the dynamic deformation measurement process of a large aircraft is taken as an example for illustration. The measured dimensions of the aircraft are: a wingspan of 50 meters, a length of 47 meters, a height of 15 meters, and a leading edge sweep angle of 24 degrees. Such as figure 1 As shown in Fig. 1, a 1:10 half-wing measurement model is built indoors, in which the plastic plate can be used to simulate the wing, and the irregular swing can be used to simulate the deformation of the wing. Since the measurement scale of this embodiment is relatively large, the traditional speckle for small scale applications is no longer applicable. In this embodiment, elliptical speckles can be used.

[0023] Such as figure 2 As shown, the ellipt...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an elliptical speckle generation method for large-viewing-field large-dip-angle measurement. The method includes the following steps that firstly, the size of each elliptical speckle area in a shot image is estimated according to the size of an image sub-area related to a measuring viewing field, and the density of the elliptical speckle areas in a printing page is determined according to the size of the set printing page and the estimated sizes of the elliptical speckle areas; secondly, according to the sizes of the elliptical speckle areas in the horizontal direction, long axis length is generated for each elliptical speckle randomly, and short axis length of each elliptical speckle is determined according to the included angle between a camera optical axis and the normal of the measured surface; thirdly, according to the sizes of the elliptical speckle areas and the long and short axis sizes of the elliptical speckles, the coordinates of an ellipse center pint are generated randomly for each elliptical speckle; fourthly, according to the coordinates of the center point, the long and short axis lengths and density of each elliptical speckle, an electronic speckle pattern corresponding to a speckle pattern coated on the measured surface is generated on the printing page.

Description

technical field [0001] The invention relates to the field of non-contact deformation measurement, in particular to an elliptical speckle generation method for large field of view and large inclination angle measurement. Background technique [0002] In the measurement of parameters such as displacement and deformation of the surface of the measured object by digital image correlation, the speckle pattern is used to match and locate the surface features of the measured surface. Therefore, generating a speckle pattern with a good recognition effect is a prerequisite for the entire measurement process . [0003] The speckle used in the digital image correlation method is produced by spraying black and white paint on the surface of the measured object. For large aircraft, due to the large format of the wing, the field of view captured by the camera is also large, which puts forward new requirements for the speckle pattern, that is, it needs to be able to reflect the surface of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16G01B11/02
Inventor 梁晋千勃兴王立忠胡浩李磊刚魏斌郭楠
Owner XI AN JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com