Function automation testing system and testing method based on SoPC chip

Abstract

The invention provides a function automation testing system and testing method based on a SoPC chip. The system comprises a serial communication interface testing module, an I2C testing module, an interrupt processing testing module, a timer testing module, a counter testing module, a bus testing module, an analogue switch/ADC testing module, a GPIO testing module, an FPGA configuration module, a communication module and a testing control module. According to the automation testing method, in the same testing system, all function modules of the SoPC chip are tested in the same testing program according to testing needs, the situation that return of all testing projects is compiled when different functions of the same SoPC chip are tested through a traditional testing method is avoided, testing time can be effectively shortened, and testing difficulty and testing operation complexity are lowered.

Description

technical field [0001] The invention relates to the field of SoPC (System-on-Programmable-Chip) chips, in particular to a SoPC chip-based functional test system and a test method thereof, which realize hardware function screening before chip storage and hardware function confirmation before delivery. Background technique [0002] With the development of microelectronics technology, computer technology and EDA technology, and the increasing demand for miniaturization, flexibility and low power consumption of electronic control systems of weapons and space vehicles, SoPC technology has emerged. SoPC is the integration of SoC and FPGA technology, finding a compromise between ASIC and programmable logic device, it integrates system design such as processor, memory, FPGA and peripheral interface into one chip as needed, and replaces it with one chip It replaces the traditional electronic system, realizes the miniaturization, light weight, high integration, low power consumption, ...

AI Technical Summary

Problems solved by technology

This test method usually writes the entire test system as a whole, and compiles the test program according to the function to be tested, and each compilation takes a lot of time

[0004] To sum up, when the traditional test method tests different functions of the same SoPC chip, the test system is complex to build, takes a long time, has poor reusability, and is difficult to maintain, which increases the difficulty of testing and operational complexity

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